Kanad Chakraborty

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Embedded memory testing using back-to-back write/read operations
- Patent number 9,728,273
- Issue date Aug 8, 2017
- Lattice Semiconductor Corporation
- Kanad Chakraborty
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable circuits for correcting scan-test circuitry defects in...
- Patent number 9,618,579
- Issue date Apr 11, 2017
- Lattice Semiconductor Corporation
- Kanad Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive technique for adjusting signal development across bit line...
- Patent number 9,530,486
- Issue date Dec 27, 2016
- LATTICE SEMICONDUCTOR CORPORATION
- Kanad Chakraborty
- G11 - INFORMATION STORAGE
Information Patent Grant
Highly secure and extensive scan testing of integrated circuits
- Patent number 8,977,917
- Issue date Mar 10, 2015
- Lattice Semiconductor Corporation
- Wei Han
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Programmable Circuits for Correcting Scan-Test Circuitry Defects in...
- Publication number 20160320448
- Publication date Nov 3, 2016
- Lattice Semiconductor Corporation
- Kanad Chakraborty
- G01 - MEASURING TESTING
Information Patent Application
Embedded Memory Testing Using Back-To-Back Write/Read Operations
- Publication number 20150340103
- Publication date Nov 26, 2015
- Lattice Semiconductor Corporation
- Kanad Chakraborty
- G11 - INFORMATION STORAGE
Information Patent Application
Configurable Test Address And Data Generation For Multimode Memory...
- Publication number 20150310933
- Publication date Oct 29, 2015
- Lattice Semiconductor Corporation
- Naveen Purushotham
- G11 - INFORMATION STORAGE
Information Patent Application
HIGHLY SECURE AND EXTENSIVE SCAN TESTING OF INTEGRATED CIRCUITS
- Publication number 20140136914
- Publication date May 15, 2014
- Lattice Semiconductor Corporation
- Wei Han
- G01 - MEASURING TESTING