Kanako Harada

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection condition setting program, inspection device and inspect...
- Patent number 6,928,375
- Issue date Aug 9, 2005
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analysis program, defect inspection apparatus, defe...
- Patent number 6,826,735
- Issue date Nov 30, 2004
- Hitachi, Ltd.
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection condition setting program, inspection device and inspect...
- Publication number 20050195396
- Publication date Sep 8, 2005
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Application
Inspection condition setting program, inspection device and inspect...
- Publication number 20030195712
- Publication date Oct 16, 2003
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analysis program, defect inspection apparatus, defe...
- Publication number 20030058436
- Publication date Mar 27, 2003
- Makoto Ono
- G01 - MEASURING TESTING