Kanako Ogawa

Person

  • Hino-shi, JP

Patents Applicationslast 30 patents

  • Information Patent Application

    ANALYSIS METHOD

    • Publication number 20230091706
    • Publication date Mar 23, 2023
    • Kabushiki Kaisha Toshiba
    • Kanako OGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method of detecting decabromodiphenyl ether

    • Publication number 20070100171
    • Publication date May 3, 2007
    • Kabushiki Kaisha Toshiba
    • Kanako Ogawa
    • G01 - MEASURING TESTING