Membership
Tour
Register
Log in
Kanako Ogawa
Follow
Person
Hino-shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Applications
last 30 patents
Information
Patent Application
ANALYSIS METHOD
Publication number
20230091706
Publication date
Mar 23, 2023
Kabushiki Kaisha Toshiba
Kanako OGAWA
G01 - MEASURING TESTING
Information
Patent Application
Method of detecting decabromodiphenyl ether
Publication number
20070100171
Publication date
May 3, 2007
Kabushiki Kaisha Toshiba
Kanako Ogawa
G01 - MEASURING TESTING