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Kaname Nishiue
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Ritto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray inspection device
Patent number
11,147,149
Issue date
Oct 12, 2021
ISHIDA CO., LTD.
Hiromu Nishimura
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus
Patent number
7,060,913
Issue date
Jun 13, 2006
ISHIDA CO., LTD.
Kaname Nishiue
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-RAY INSPECTION DEVICE
Publication number
20200253032
Publication date
Aug 6, 2020
ISHIDA CO., LTD.
Hiromu NISHIMURA
G01 - MEASURING TESTING
Information
Patent Application
Measuring apparatus
Publication number
20040173388
Publication date
Sep 9, 2004
Kaname Nishiue
G01 - MEASURING TESTING