Kaname Nishiue

Person

  • Ritto-shi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray inspection device

    • Patent number 11,147,149
    • Issue date Oct 12, 2021
    • ISHIDA CO., LTD.
    • Hiromu Nishimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring apparatus

    • Patent number 7,060,913
    • Issue date Jun 13, 2006
    • ISHIDA CO., LTD.
    • Kaname Nishiue
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY INSPECTION DEVICE

    • Publication number 20200253032
    • Publication date Aug 6, 2020
    • ISHIDA CO., LTD.
    • Hiromu NISHIMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Measuring apparatus

    • Publication number 20040173388
    • Publication date Sep 9, 2004
    • Kaname Nishiue
    • G01 - MEASURING TESTING