Kaname Takahashi

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope with a table being guided by rolling f...
- Patent number 8,969,828
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Naoki Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage device and control method for stage device
- Patent number 8,907,303
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Yasuyuki Momoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 7,964,845
- Issue date Jun 21, 2011
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 7,456,403
- Issue date Nov 25, 2008
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 6,963,069
- Issue date Nov 8, 2005
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,403,968
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Eiichi Hazaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STAGE DEVICE AND CONTROL METHOD FOR STAGE DEVICE
- Publication number 20140117251
- Publication date May 1, 2014
- Hitachi High-Technologies Corporation
- Yasuyuki Momoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STAGE APPARATUS
- Publication number 20130082190
- Publication date Apr 4, 2013
- Hitachi High-Technologies Corporation
- Yasuyuki Momoi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20130056636
- Publication date Mar 7, 2013
- Hitachi High-Technologies Corporation
- Shigeru Haneda
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20130048854
- Publication date Feb 28, 2013
- Hitachi High-Technologies Corporation
- Naoki Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device
- Publication number 20090050803
- Publication date Feb 26, 2009
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device
- Publication number 20070235645
- Publication date Oct 11, 2007
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device
- Publication number 20040238752
- Publication date Dec 2, 2004
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS