Kangho LEE

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector and method of operating the same
- Patent number 10,042,061
- Issue date Aug 7, 2018
- Samsung Electronics Co., Ltd.
- Dongwook Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method for removing of residual charge, X-ray imaging method and ap...
- Patent number 9,961,754
- Issue date May 1, 2018
- Samsung Electronics Co., Ltd.
- Young Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray detecting method, photographing method using the X-ray detect...
- Patent number 9,736,398
- Issue date Aug 15, 2017
- Samsung Electronics Co., Ltd.
- Young Kim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method of detecting X-ray, and X-ray imaging system
- Patent number 9,547,092
- Issue date Jan 17, 2017
- Samsung Electronics Co., Ltd.
- Young Kim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD OF DETECTING X-RAY, AND X-RAY IMAGING SYSTEM
- Publication number 20160116611
- Publication date Apr 28, 2016
- Samsung Electronics Co., Ltd.
- Young KIM
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTION APPARATUS AND METHOD OF DRIVING THE SAME
- Publication number 20160116612
- Publication date Apr 28, 2016
- Samsung Electronics Co., Ltd.
- Kangho LEE
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR AND METHOD OF OPERATING THE SAME
- Publication number 20160041275
- Publication date Feb 11, 2016
- Samsung Electronics Co., Ltd.
- Dongwook LEE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTING METHOD, PHOTOGRAPHING METHOD USING THE X-RAY DETECT...
- Publication number 20150326802
- Publication date Nov 12, 2015
- Samsung Electronics Co., Ltd.
- Young KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REMOVING OF RESIDUAL CHARGE, X-RAY IMAGING METHOD AND AP...
- Publication number 20150063544
- Publication date Mar 5, 2015
- Samsung Electronics Co. Ltd.
- Young KIM
- G01 - MEASURING TESTING