Kangpeng Shao

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Hangzhou, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing a plurality of transistors in a target chip
- Patent number 9,146,270
- Issue date Sep 29, 2015
- SEMITRONIX CORPORATION
- Kangpeng Shao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Testing a Plurality of Transistors in a Target Chip
- Publication number 20150002184
- Publication date Jan 1, 2015
- Semitronix Corporation
- Kangpeng Shao
- G01 - MEASURING TESTING