Kanji Kinameri

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning photon microscope for simulataneously displaying both the...
- Patent number 4,791,288
- Issue date Dec 13, 1988
- Hitachi, Ltd.
- Kanji Kinameri
- G02 - OPTICS
Information Patent Grant
Pattern defect inspection apparatus
- Patent number 4,731,855
- Issue date Mar 15, 1988
- Hitachi, Ltd.
- Kyo Suda
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional structure viewer and method of viewing three-dime...
- Patent number 4,702,607
- Issue date Oct 27, 1987
- Hitachi, Ltd.
- Kanji Kinameri
- G01 - MEASURING TESTING