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Kanji KOBAYASHI

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  • Kyoto-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Surface analysis device
    • Patent number 11,499,989
    • Issue date Nov 15, 2022
    • Shimadzu Corporation
    • Kanji Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scanning probe microscope
    • Patent number 10,254,307
    • Issue date Apr 9, 2019
    • Shimadzu Corporation
    • Kanji Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    X-ray fluorescence spectrometer
    • Patent number 10,168,290
    • Issue date Jan 1, 2019
    • Shimadzu Corporation
    • Hiroaki Furukawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scanning probe microscope
    • Patent number 10,088,499
    • Issue date Oct 2, 2018
    • Shimadzu Corporation
    • Kanji Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scanning-type probe microscope
    • Patent number 8,181,267
    • Issue date May 15, 2012
    • Shimadzu Corporation
    • Kanji Kobayashi
    • B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY ANALYZER
    • Publication number 20230236142
    • Publication date Jul 27, 2023
    • Shimadzu Corporation
    • Yuji MORIHISA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SURFACE ANALYSIS DEVICE
    • Publication number 20210349125
    • Publication date Nov 11, 2021
    • Shimadzu Corporation
    • Kanji KOBAYASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCANNING PROBE MICROSCOPE
    • Publication number 20180259552
    • Publication date Sep 13, 2018
    • Shimadzu Corporation
    • Kanji KOBAYASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCANNING PROBE MICROSCOPE
    • Publication number 20180106832
    • Publication date Apr 19, 2018
    • Shimadzu Corporation
    • Kanji KOBAYASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY FLUORESCENCE SPECTROMETER
    • Publication number 20160116424
    • Publication date Apr 28, 2016
    • SHIMADZU CORPORATION
    • Hiroaki FURUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Scanning-type Probe Microscope
    • Publication number 20110307979
    • Publication date Dec 15, 2011
    • Shimadzu Corporation
    • Kanji KOBAYASHI
    • G01 - MEASURING TESTING