Kanji Nagasawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Thermo-gravimetric apparatus
- Patent number 10,088,402
- Issue date Oct 2, 2018
- Hitachi High-Tech Science Corporation
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analyzer
- Patent number 9,033,574
- Issue date May 19, 2015
- Hitachi High-Tech Science Corporation
- Kanji Nagasawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and X-ray analysis method
- Patent number 8,068,583
- Issue date Nov 29, 2011
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analysis apparatus
- Patent number 7,744,273
- Issue date Jun 29, 2010
- SII NanoTechnology Inc.
- Kanji Nagasawa
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analysis apparatus and method capable of accurately measuri...
- Patent number 6,390,674
- Issue date May 21, 2002
- Seiko Instruments Inc.
- Nobutaka Nakamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Thermal Analyzer
- Publication number 20150153292
- Publication date Jun 4, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
- Publication number 20100002833
- Publication date Jan 7, 2010
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ANALYSIS APPARATUS
- Publication number 20080279249
- Publication date Nov 13, 2008
- Kanji NAGASAWA
- G01 - MEASURING TESTING