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Kasugai, JP
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last 30 patents
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Patent Grant
Semiconductor device and operation monitoring method for semiconduc...
Patent number
8,742,786
Issue date
Jun 3, 2014
Fujitsu Semiconductor Limited
Kazufumi Komura
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE AND OPERATION MONITORING METHOD FOR SEMICONDUC...
Publication number
20090243627
Publication date
Oct 1, 2009
Fujitsu Microelectronics Limited
Kazufumi KOMURA
G01 - MEASURING TESTING