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Patents Grants
last 30 patents
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Patent Grant
Method for analyzing evolved gas and evolved gas analyzer
Patent number
9,899,198
Issue date
Feb 20, 2018
Hitachi High-Tech Science Corporation
Hideyuki Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for correcting evolved gas analyzer and evolved gas analyzer
Patent number
9,897,579
Issue date
Feb 20, 2018
Hitachi High-Tech Science Corporation
Hideyuki Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for analyzing evolved gas and evolved gas analyzer
Patent number
9,831,077
Issue date
Nov 28, 2017
Hitachi High-Tech Science Corporation
Hideyuki Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
METHOD FOR CORRECTING EVOLVED GAS ANALYZER AND EVOLVED GAS ANALYZER
Publication number
20170146497
Publication date
May 25, 2017
HITACHI HIGH-TECH SCIENCE CORPORATION
Hideyuki AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING EVOLVED GAS AND EVOLVED GAS ANALYZER
Publication number
20170148616
Publication date
May 25, 2017
HITACHI HIGH-TECH SCIENCE CORPORATION
Hideyuki AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING EVOLVED GAS AND EVOLVED GAS ANALYZER
Publication number
20170148617
Publication date
May 25, 2017
HITACHI HIGH-TECH SCIENCE CORPORATION
Hideyuki AKIYAMA
G01 - MEASURING TESTING