Kaori ARAI

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Nirasaki City, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for appointing orientation flat, apparatus for detecting ori...
- Patent number 8,700,206
- Issue date Apr 15, 2014
- Tokyo Electron Limited
- Kaori Arai
- G01 - MEASURING TESTING
Information Patent Grant
Pre-alignment method of semiconductor wafer and computer-readable r...
- Patent number 8,319,510
- Issue date Nov 27, 2012
- Tokyo Electron Limited
- Kazuhito Ogino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING APPARATUS AND SUBSTRATE TRANSFER METHOD
- Publication number 20240178034
- Publication date May 30, 2024
- TOKYO ELECTRON LIMITED
- Tadashi OBIKANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRE-ALIGNMENT METHOD OF SEMICONDUCTOR WAFER AND COMPUTER-READABLE R...
- Publication number 20100321052
- Publication date Dec 23, 2010
- TOKYO ELECTRON LIMITED
- Kazuhito OGINO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR APPOINTING ORIENTATION FLAT, APPARATUS FOR DETECTING ORI...
- Publication number 20100249986
- Publication date Sep 30, 2010
- TOKYO ELECTRON LIMITED
- Kaori ARAI
- G01 - MEASURING TESTING