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Kaori BIZEN
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle beam apparatus and control method
Patent number
11,610,756
Issue date
Mar 21, 2023
HITACHI HIGH-TECH CORPORATION
Kaori Bizen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Calibration sample, electron beam adjustment method and electron be...
Patent number
11,435,178
Issue date
Sep 6, 2022
HITACHI HIGH-TECH CORPORATION
Yasunari Sohda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope and method for measuring pattern
Patent number
11,276,554
Issue date
Mar 15, 2022
HITACHI HIGH-TECH CORPORATION
Takeyoshi Ohashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
11,251,018
Issue date
Feb 15, 2022
HITACHI HIGH-TECH CORPORATION
Yasunari Sohda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
10,636,618
Issue date
Apr 28, 2020
Hitachi High-Technologies Corporation
Kaori Bizen
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD
Publication number
20220115203
Publication date
Apr 14, 2022
HITACHI HIGH-TECH CORPORATION
Kaori BIZEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20210313140
Publication date
Oct 7, 2021
Kaori BIZEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning Electron Microscope
Publication number
20210272770
Publication date
Sep 2, 2021
Hitachi High-Tech Corporation
Yasunari SOHDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CALIBRATION SAMPLE, ELECTRON BEAM ADJUSTMENT METHOD AND ELECTRON BE...
Publication number
20210131801
Publication date
May 6, 2021
Hitachi High-Technologies Corporation
Yasunari SOHDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR MEASURING PATTERN
Publication number
20210043420
Publication date
Feb 11, 2021
HITACHI HIGH-TECH CORPORATION
Takeyoshi Ohashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS
Publication number
20190066969
Publication date
Feb 28, 2019
Hitachi High-Technologies Corporation
Kaori BIZEN
H01 - BASIC ELECTRIC ELEMENTS