Kaori YAESHIMA

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Hitachinaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect observation device
- Patent number 10,770,260
- Issue date Sep 8, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT OBSERVATION DEVICE
- Publication number 20190237296
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR PREPARING SPECIMEN
- Publication number 20140084159
- Publication date Mar 27, 2014
- Hitachi High-Technologies Corporation
- Kaori Yaeshima
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE OBSERVATION APPARATUS AND METHOD OF MARKING
- Publication number 20130134308
- Publication date May 30, 2013
- Hitachi High-Technologies Corporation
- Fumiaki ENDO
- G01 - MEASURING TESTING