Kaoru FUKAYA

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation condition setting method of semiconductor device, and ev...
- Patent number 9,947,088
- Issue date Apr 17, 2018
- Hitachi High-Technologies Corporation
- Hiroyuki Sindo
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Pattern Inspection/Measurement Device, and Pattern Inspection/Measu...
- Publication number 20230194253
- Publication date Jun 22, 2023
- Hitachi High-Tech Corporation
- Ryugo KAGETANI
- G01 - MEASURING TESTING
Information Patent Application
Evaluation Condition Setting Method of Semiconductor Device, and Ev...
- Publication number 20170032212
- Publication date Feb 2, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki SINDO
- G06 - COMPUTING CALCULATING COUNTING