Kaoru Kumagai

Person

Tokyo-to, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Flight control system for unmanned aerial vehicle and topography me...
- Patent number 11,999,480
- Issue date Jun 4, 2024
- TOPCON Corporation
- Riccardo Loti
- G01 - MEASURING TESTING
Information Patent Grant
Tilt detecting device and surveying instrument
- Patent number 11,940,274
- Issue date Mar 26, 2024
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument having wavelength dispersion compensation pris...
- Patent number 11,698,254
- Issue date Jul 11, 2023
- TOPCON Corporation
- Ikuo Ishinabe
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,598,637
- Issue date Mar 7, 2023
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument and surveying instrument system
- Patent number 11,598,874
- Issue date Mar 7, 2023
- TOPCON Corporation
- Fumio Ohtomo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surveying system
- Patent number 11,598,854
- Issue date Mar 7, 2023
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Target instrument and surveying system
- Patent number 11,550,034
- Issue date Jan 10, 2023
- TOPCON Corporation
- Kaoru Kumagai
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,512,957
- Issue date Nov 29, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument and surveying instrument system
- Patent number 11,506,759
- Issue date Nov 22, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying device
- Patent number 11,460,548
- Issue date Oct 4, 2022
- Topcon Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,421,989
- Issue date Aug 23, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,415,414
- Issue date Aug 16, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surveying instrument and surveying instrument system
- Patent number 11,402,206
- Issue date Aug 2, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Laser measuring method and laser measuring instrument
- Patent number 11,402,506
- Issue date Aug 2, 2022
- TOPCON Corporation
- Fumio Ohtomo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surveying instrument
- Patent number 11,402,207
- Issue date Aug 2, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,333,496
- Issue date May 17, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Positioning device, positioning method, and program
- Patent number 11,313,680
- Issue date Apr 26, 2022
- Topcon Corporation
- Kaoru Kumagai
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,293,754
- Issue date Apr 5, 2022
- TOPCON Corporation
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument and photogrammetric method
- Patent number 11,193,765
- Issue date Dec 7, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method and laser scanner
- Patent number 11,150,346
- Issue date Oct 19, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,143,505
- Issue date Oct 12, 2021
- TOPCON Corporation
- Kaoru Kumagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deflecting device and surveying instrument
- Patent number 11,029,154
- Issue date Jun 8, 2021
- Topcon Corporation
- Hideyuki Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanner and surveying system
- Patent number 10,983,196
- Issue date Apr 20, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying system
- Patent number 10,982,957
- Issue date Apr 20, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying system
- Patent number 10,921,430
- Issue date Feb 16, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying system
- Patent number 10,895,632
- Issue date Jan 19, 2021
- Topcon Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 10,823,558
- Issue date Nov 3, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument
- Patent number 10,823,823
- Issue date Nov 3, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanner
- Patent number 10,809,360
- Issue date Oct 20, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Aerial photogrammetric device and aerial photogrammetric method
- Patent number 10,800,344
- Issue date Oct 13, 2020
- TOPCON Corporation
- Fumio Ohtomo
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
WORK RESULT INFORMATION ACQUISITION DEVICE, WORK RESULT INFORMATION...
- Publication number 20230316181
- Publication date Oct 5, 2023
- TOPCON CORPORATION
- Kaoru KUMAGAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLIGHT CONTROL SYSTEM FOR UNMANNED AERIAL VEHICLE AND TOPOGRAPHY ME...
- Publication number 20230010931
- Publication date Jan 12, 2023
- TOPCON Corporation
- Riccardo Loti
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
REVERSING ACTUATION TYPE INERTIA DETECTING DEVICE AND SURVEYING INS...
- Publication number 20220317149
- Publication date Oct 6, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20220229182
- Publication date Jul 21, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument, Surveying Method And Surveying Program
- Publication number 20220163328
- Publication date May 26, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Flight Control System For Unmanned Aerial Vehicle And Topography Me...
- Publication number 20220153413
- Publication date May 19, 2022
- TOPCON Corporation
- Loti Riccardo
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
Tracking Method, Laser Scanner, And Tracking Program
- Publication number 20220099807
- Publication date Mar 31, 2022
- TOPCON Corporation
- Takeshi Sasaki
- G01 - MEASURING TESTING
Information Patent Application
SURVEY APPARATUS AND SURVEY PROGRAM
- Publication number 20220091264
- Publication date Mar 24, 2022
- TOPCON CORPORATION
- Takeshi SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Surveying System
- Publication number 20210382143
- Publication date Dec 9, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Surveying Instrument System
- Publication number 20210293962
- Publication date Sep 23, 2021
- TOPCON CORPORATION
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Tilt Detecting Device And Surveying Instrument
- Publication number 20210116241
- Publication date Apr 22, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Surveying Instrument System
- Publication number 20210088333
- Publication date Mar 25, 2021
- TOPCON Corporation
- Ikuo Ishinabe
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200386546
- Publication date Dec 10, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200386547
- Publication date Dec 10, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING DEVICE, POSITIONING METHOD, AND PROGRAM
- Publication number 20200340811
- Publication date Oct 29, 2020
- TOPCON CORPORATION
- Kaoru KUMAGAI
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200318963
- Publication date Oct 8, 2020
- TOPCON CORPORATION
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200318966
- Publication date Oct 8, 2020
- TOPCON Corporation
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Application
Target Instrument And Surveying System
- Publication number 20200271758
- Publication date Aug 27, 2020
- TOPCON Corporation
- Kaoru Kumagai
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Photogrammetric Method
- Publication number 20200182614
- Publication date Jun 11, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Surveying Instrument System
- Publication number 20200096334
- Publication date Mar 26, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200081266
- Publication date Mar 12, 2020
- TOPCON CORPORATION
- Fumio Ohtomo
- G02 - OPTICS
Information Patent Application
Surveying Instrument
- Publication number 20190360806
- Publication date Nov 28, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying System
- Publication number 20190346539
- Publication date Nov 14, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G02 - OPTICS
Information Patent Application
Surveying Instrument
- Publication number 20190339075
- Publication date Nov 7, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
SURVEYING DEVICE
- Publication number 20190302236
- Publication date Oct 3, 2019
- TOPCON CORPORATION
- Fumio OHTOMO
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20190186912
- Publication date Jun 20, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20190162853
- Publication date May 30, 2019
- TOPCON Corporation
- Kaoru Kumagai
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Surveying Instrument System
- Publication number 20190154805
- Publication date May 23, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Laser Measuring Method And Laser Measuring Instrument
- Publication number 20190094363
- Publication date Mar 28, 2019
- TOPCON CORPORATION
- Fumio Ohtomo
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
Surveying System
- Publication number 20190063922
- Publication date Feb 28, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING

Kaoru Kumagai

Person

Patents Grantslast 30 patents

Flight control system for unmanned aerial vehicle and topography me...

Tilt detecting device and surveying instrument

Surveying instrument having wavelength dispersion compensation pris...

Surveying instrument

Surveying instrument and surveying instrument system

Surveying system

Target instrument and surveying system

Surveying instrument

Surveying instrument and surveying instrument system

Surveying device

Surveying instrument

Surveying instrument

Surveying instrument and surveying instrument system

Laser measuring method and laser measuring instrument

Surveying instrument

Surveying instrument

Positioning device, positioning method, and program

Surveying instrument

Surveying instrument and photogrammetric method

Measuring method and laser scanner

Surveying instrument

Deflecting device and surveying instrument

Laser scanner and surveying system

Surveying system

Surveying system

Surveying system

Surveying instrument

Measuring instrument

Laser scanner

Aerial photogrammetric device and aerial photogrammetric method

Patents Applicationslast 30 patents

WORK RESULT INFORMATION ACQUISITION DEVICE, WORK RESULT INFORMATION...

FLIGHT CONTROL SYSTEM FOR UNMANNED AERIAL VEHICLE AND TOPOGRAPHY ME...

REVERSING ACTUATION TYPE INERTIA DETECTING DEVICE AND SURVEYING INS...

Surveying Instrument

Surveying Instrument, Surveying Method And Surveying Program

Flight Control System For Unmanned Aerial Vehicle And Topography Me...

Tracking Method, Laser Scanner, And Tracking Program

SURVEY APPARATUS AND SURVEY PROGRAM

Surveying Instrument And Surveying System

Surveying Instrument And Surveying Instrument System

Tilt Detecting Device And Surveying Instrument

Surveying Instrument And Surveying Instrument System

Surveying Instrument

Surveying Instrument

POSITIONING DEVICE, POSITIONING METHOD, AND PROGRAM

Surveying Instrument

Surveying Instrument

Target Instrument And Surveying System

Surveying Instrument And Photogrammetric Method

Surveying Instrument And Surveying Instrument System

Surveying Instrument

Surveying Instrument

Surveying System

Surveying Instrument

SURVEYING DEVICE

Surveying Instrument

Surveying Instrument

Surveying Instrument And Surveying Instrument System

Laser Measuring Method And Laser Measuring Instrument

Surveying System