Kaoru Miyata

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional geometry measurement apparatus and three-dimensio...
- Patent number 11,948,321
- Issue date Apr 2, 2024
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional geometry measurement apparatus and three-dimensio...
- Patent number 11,636,614
- Issue date Apr 25, 2023
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional geometry measurement apparatus and three-dimensio...
- Patent number 11,449,970
- Issue date Sep 20, 2022
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional geometry measurement apparatus and three-dimensio...
- Patent number 11,361,458
- Issue date Jun 14, 2022
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional geometry measurement apparatus and three-dimensio...
- Patent number 10,891,746
- Issue date Jan 12, 2021
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional geometry measurement apparatus and three-dimensio...
- Patent number 10,529,082
- Issue date Jan 7, 2020
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Geometry measurement system, geometry measurement apparatus, and ge...
- Patent number 10,317,192
- Issue date Jun 11, 2019
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lightwave interferometric distance measuring method and apparatus u...
- Patent number 8,368,900
- Issue date Feb 5, 2013
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring instrument and displacement measuring method
- Patent number 8,081,315
- Issue date Dec 20, 2011
- Mitutoyo Corporation
- Kaoru Miyata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...
- Publication number 20220270274
- Publication date Aug 25, 2022
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...
- Publication number 20210224960
- Publication date Jul 22, 2021
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...
- Publication number 20210174531
- Publication date Jun 10, 2021
- Mitutoyo Corporation
- Kaoru Miyata
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...
- Publication number 20200334844
- Publication date Oct 22, 2020
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...
- Publication number 20200090356
- Publication date Mar 19, 2020
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...
- Publication number 20180365847
- Publication date Dec 20, 2018
- Mitutoyo Corporation
- Kaoru Miyata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GEOMETRY MEASUREMENT SYSTEM, GEOMETRY MEASUREMENT APPARATUS, AND GE...
- Publication number 20170241767
- Publication date Aug 24, 2017
- Mitutoyo Corporation
- Kaoru Miyata
- G01 - MEASURING TESTING
Information Patent Application
LIGHTWAVE INTERFEROMETRIC DISTANCE MEASURING METHOD AND APPARATUS
- Publication number 20100026983
- Publication date Feb 4, 2010
- MITUTOYO CORPORATION
- Kazuhiko KAWASAKI
- G01 - MEASURING TESTING
Information Patent Application
Displacement measuring instrument and displacement measuring method
- Publication number 20100027026
- Publication date Feb 4, 2010
- Mitutoyo Corporation
- Kaoru Miyata
- G01 - MEASURING TESTING
Information Patent Application
TWO-WAVELENGTH LASER INTERFEROMETER AND METHOD OF ADJUSTING OPTICAL...
- Publication number 20090310141
- Publication date Dec 17, 2009
- MITUTOYO CORPORATION
- Kaoru Miyata
- G01 - MEASURING TESTING

Kaoru Miyata

Person

Patents Grantslast 30 patents

Three-dimensional geometry measurement apparatus and three-dimensio...

Three-dimensional geometry measurement apparatus and three-dimensio...

Three-dimensional geometry measurement apparatus and three-dimensio...

Three-dimensional geometry measurement apparatus and three-dimensio...

Three-dimensional geometry measurement apparatus and three-dimensio...

Three-dimensional geometry measurement apparatus and three-dimensio...

Geometry measurement system, geometry measurement apparatus, and ge...

Lightwave interferometric distance measuring method and apparatus u...

Displacement measuring instrument and displacement measuring method

Patents Applicationslast 30 patents

THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...

THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...

THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...

THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...

THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...

THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIO...

GEOMETRY MEASUREMENT SYSTEM, GEOMETRY MEASUREMENT APPARATUS, AND GE...

LIGHTWAVE INTERFEROMETRIC DISTANCE MEASURING METHOD AND APPARATUS

Displacement measuring instrument and displacement measuring method

TWO-WAVELENGTH LASER INTERFEROMETER AND METHOD OF ADJUSTING OPTICAL...