Kaoru Sakai

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection method and apparatus
- Patent number 10,529,068
- Issue date Jan 7, 2020
- Hitachi Power Solutions Co., Ltd.
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 10,354,372
- Issue date Jul 16, 2019
- Hitachi Power Solutions Co., Ltd.
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,075,026
- Issue date Jul 7, 2015
- Hitachi High-Technologies Corporation
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting patterns formed on a substrate
- Patent number 8,824,774
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and device thereof
- Patent number 8,811,712
- Issue date Aug 19, 2014
- Hitachi High-Technologies Corporation
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 8,755,041
- Issue date Jun 17, 2014
- Hitachi High-Technologies Corporation
- Yuta Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting defect
- Patent number 8,737,718
- Issue date May 27, 2014
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting pattern defects
- Patent number 8,639,019
- Issue date Jan 28, 2014
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Fault inspection method
- Patent number 8,582,864
- Issue date Nov 12, 2013
- Hitachi High-Technologies Corporation
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting patterns formed on a substrate
- Patent number 8,467,594
- Issue date Jun 18, 2013
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 8,427,634
- Issue date Apr 23, 2013
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus therefor
- Patent number 8,340,395
- Issue date Dec 25, 2012
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system and method of the same
- Patent number 8,274,652
- Issue date Sep 25, 2012
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting pattern defects
- Patent number 8,275,190
- Issue date Sep 25, 2012
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pattern inspection
- Patent number 8,270,700
- Issue date Sep 18, 2012
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting a pattern formed on a substrate
- Patent number 8,253,934
- Issue date Aug 28, 2012
- Hitachi High-Technologies Corporation
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Fault inspection method
- Patent number 8,103,087
- Issue date Jan 24, 2012
- Hitachi High-Technologies Corporation
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and its apparatus
- Patent number 8,090,187
- Issue date Jan 3, 2012
- Hitachi, Ltd.
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting pattern defects
- Patent number 8,005,292
- Issue date Aug 23, 2011
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and its apparatus
- Patent number 7,949,178
- Issue date May 24, 2011
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting pattern defects
- Patent number 7,903,249
- Issue date Mar 8, 2011
- Hitachi, Ltd.
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and its apparatus, inspection system
- Patent number 7,869,966
- Issue date Jan 11, 2011
- Hitachi, Ltd.
- Takafumi Okabe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a defect of a pattern
- Patent number 7,848,563
- Issue date Dec 7, 2010
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting pattern defects
- Patent number 7,792,352
- Issue date Sep 7, 2010
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and its apparatus
- Patent number 7,711,178
- Issue date May 4, 2010
- Hitachi, Ltd.
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 7,664,608
- Issue date Feb 16, 2010
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a pattern formed on a substrate
- Patent number 7,646,477
- Issue date Jan 12, 2010
- Hitachi High-Technologies Corporation
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pattern inspection
- Patent number 7,620,232
- Issue date Nov 17, 2009
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting pattern defects
- Patent number 7,489,395
- Issue date Feb 10, 2009
- Hitachi High-Technologies Corporation, Ltd.
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection method and apparatus therefor
- Patent number 7,462,827
- Issue date Dec 9, 2008
- Hitachi-GE Nuclear Energy, Ltd.
- Toshio Asano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ULTRASONIC INSPECTION DEVICE, ULTRASONIC INSPECTION METHOD, AND PRO...
- Publication number 20240036010
- Publication date Feb 1, 2024
- Hitachi Power Solutions Co., Ltd.
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Application
Ultrasonic Testing Device and Ultrasonic Testing Method
- Publication number 20220283124
- Publication date Sep 8, 2022
- Hitachi Power Solutions Co., Ltd.
- Kaoru SAKAI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20190197680
- Publication date Jun 27, 2019
- HITACHI POWER SOLUTIONS CO., LTD.
- Kaoru SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20190050978
- Publication date Feb 14, 2019
- HITACHI POWER SOLUTIONS CO., LTD.
- Kaoru SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20180101944
- Publication date Apr 12, 2018
- HITACHI POWER SOLUTIONS CO., LTD.
- Kaoru SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE EXAMINATION METHOD AND DEVICE THEREFOR
- Publication number 20150362310
- Publication date Dec 17, 2015
- Hitachi, Ltd
- Atsushi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20130343632
- Publication date Dec 26, 2013
- Hitachi High-Technologies Corporation
- Yuta URANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE THEREOF
- Publication number 20130329039
- Publication date Dec 12, 2013
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERNS FORMED ON A SUBSTRATE
- Publication number 20130307963
- Publication date Nov 21, 2013
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS
- Publication number 20130004057
- Publication date Jan 3, 2013
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PATTERN INSPECTION
- Publication number 20130002849
- Publication date Jan 3, 2013
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE THEREOF
- Publication number 20120294507
- Publication date Nov 22, 2012
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20120229618
- Publication date Sep 13, 2012
- Takahiro Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT INSPECTION METHOD
- Publication number 20120207382
- Publication date Aug 16, 2012
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECT
- Publication number 20120141012
- Publication date Jun 7, 2012
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND ITS APPARATUS
- Publication number 20120076396
- Publication date Mar 29, 2012
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERNS FORMED ON A SUBSTRATE
- Publication number 20120002860
- Publication date Jan 5, 2012
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTING APPARATUS AND DEFECT INSPECTING METHOD
- Publication number 20110311126
- Publication date Dec 22, 2011
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS
- Publication number 20110304725
- Publication date Dec 15, 2011
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE THEREOF
- Publication number 20110274342
- Publication date Nov 10, 2011
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CHECK METHOD AND DEVICE THEREOF
- Publication number 20110182496
- Publication date Jul 28, 2011
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS
- Publication number 20100328446
- Publication date Dec 30, 2010
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20100182602
- Publication date Jul 22, 2010
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND ITS APPARATUS
- Publication number 20100172570
- Publication date Jul 8, 2010
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And Apparatus For Inspecting A Pattern Formed On A Substrate
- Publication number 20100104173
- Publication date Apr 29, 2010
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for pattern inspection
- Publication number 20100053319
- Publication date Mar 4, 2010
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Method and Apparatus Therefor
- Publication number 20090290783
- Publication date Nov 26, 2009
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND ITS APPARATUS
- Publication number 20090226076
- Publication date Sep 10, 2009
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND ITS APPARATUS
- Publication number 20090169093
- Publication date Jul 2, 2009
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And Apparatus For Inspecting Pattern Defects
- Publication number 20090153840
- Publication date Jun 18, 2009
- Minoru Yoshida
- G01 - MEASURING TESTING

Kaoru Sakai

Person

Patents Grantslast 30 patents

Defect inspection method and apparatus

Defect inspection method and apparatus

Defect inspection device and defect inspection method

Method and apparatus for inspecting patterns formed on a substrate

Defect inspection method and device thereof

Defect inspection method and apparatus

Apparatus and method for inspecting defect

Method and apparatus for inspecting pattern defects

Fault inspection method

Method and apparatus for inspecting patterns formed on a substrate

Defect inspection method and apparatus

Defect inspection method and apparatus therefor

Defect inspection system and method of the same

Method and apparatus for inspecting pattern defects

Method and apparatus for pattern inspection

Method and apparatus for inspecting a pattern formed on a substrate

Fault inspection method

Pattern inspection method and its apparatus

Method and apparatus for inspecting pattern defects

Pattern inspection method and its apparatus

Method and apparatus for inspecting pattern defects

Inspection method and its apparatus, inspection system

Method and apparatus for inspecting a defect of a pattern

Method and apparatus for inspecting pattern defects

Pattern inspection method and its apparatus

Defect inspection method and apparatus

Method and apparatus for inspecting a pattern formed on a substrate

Method and apparatus for pattern inspection

Method and apparatus for inspecting pattern defects

Non-destructive inspection method and apparatus therefor

Patents Applicationslast 30 patents

ULTRASONIC INSPECTION DEVICE, ULTRASONIC INSPECTION METHOD, AND PRO...

Ultrasonic Testing Device and Ultrasonic Testing Method

DEFECT INSPECTION METHOD AND APPARATUS

DEFECT INSPECTION METHOD AND APPARATUS

DEFECT INSPECTION METHOD AND APPARATUS

SHAPE EXAMINATION METHOD AND DEVICE THEREFOR

DEFECT INSPECTION METHOD AND APPARATUS

DEFECT INSPECTION METHOD AND DEVICE THEREOF

METHOD AND APPARATUS FOR INSPECTING PATTERNS FORMED ON A SUBSTRATE

METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS

METHOD AND APPARATUS FOR PATTERN INSPECTION

DEFECT INSPECTION METHOD AND DEVICE THEREOF

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

FAULT INSPECTION METHOD

APPARATUS AND METHOD FOR INSPECTING DEFECT

PATTERN INSPECTION METHOD AND ITS APPARATUS

METHOD AND APPARATUS FOR INSPECTING PATTERNS FORMED ON A SUBSTRATE

DEFECT INSPECTING APPARATUS AND DEFECT INSPECTING METHOD

METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS

DEFECT INSPECTION METHOD AND DEVICE THEREOF

DEFECT CHECK METHOD AND DEVICE THEREOF

METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS

DEFECT INSPECTION METHOD AND APPARATUS

PATTERN INSPECTION METHOD AND ITS APPARATUS

Method And Apparatus For Inspecting A Pattern Formed On A Substrate

Method and apparatus for pattern inspection

Defect Inspection Method and Apparatus Therefor

PATTERN INSPECTION METHOD AND ITS APPARATUS

PATTERN INSPECTION METHOD AND ITS APPARATUS

Method And Apparatus For Inspecting Pattern Defects