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Kaoru SHIBATA
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Itami-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical module
Patent number
10,024,516
Issue date
Jul 17, 2018
Sumitomo Electric Industries, Ltd
Takashi Kyono
F21 - LIGHTING
Information
Patent Grant
Semiconductor layered structure, method for producing semiconductor...
Patent number
9,887,310
Issue date
Feb 6, 2018
Sumitomo Electric Industries, Ltd
Katsushi Akita
C30 - CRYSTAL GROWTH
Information
Patent Grant
Epitaxial wafer and method for manufacturing same
Patent number
9,773,932
Issue date
Sep 26, 2017
Sumitomo Electric Industries, Ltd
Kei Fujii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Epitaxial wafer, method for producing the same, semiconductor eleme...
Patent number
9,698,287
Issue date
Jul 4, 2017
Sumitomo Electric Industries, Ltd
Kei Fujii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method for manufacturing the same
Patent number
9,680,040
Issue date
Jun 13, 2017
Sumitomo Electric Industries, Ltd.
Kaoru Shibata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Epitaxial wafer, method for producing the same, photodiode, and opt...
Patent number
9,171,978
Issue date
Oct 27, 2015
Sumitomo Electric Industries, Ltd
Kei Fujii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
9,123,843
Issue date
Sep 1, 2015
Sumitomo Electric Industries, Ltd
Takashi Kyono
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL MODULE
Publication number
20180010763
Publication date
Jan 11, 2018
Sumitomo Electric Industries, Ltd.
Takashi Kyono
F21 - LIGHTING
Information
Patent Application
SEMICONDUCTOR LAYERED STRUCTURE, PHOTODIODE AND SENSOR
Publication number
20170294547
Publication date
Oct 12, 2017
Sumitomo Electric Industries, Ltd.
Kaoru Shibata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR LAYERED STRUCTURE AND PHOTODIODE
Publication number
20170040477
Publication date
Feb 9, 2017
Sumitomo Electric Industries, Ltd.
Suguru Arikata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIGHT-RECEIVING DEVICE
Publication number
20160380137
Publication date
Dec 29, 2016
Sumitomo Electric Industries, Ltd.
Kaoru SHIBATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR LAYERED STRUCTURE, METHOD FOR PRODUCING SEMICONDUCTOR...
Publication number
20160351742
Publication date
Dec 1, 2016
Sumitomo Electric Industries, Ltd.
Katsushi AKITA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EPITAXIAL WAFER AND METHOD FOR MANUFACTURING SAME
Publication number
20160247951
Publication date
Aug 25, 2016
Sumitomo Electric Industries, Ltd.
Kei FUJII
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20160056315
Publication date
Feb 25, 2016
Sumitomo Electric Industries, Ltd.
Kaoru SHIBATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20150115222
Publication date
Apr 30, 2015
Sumitomo Electric Industries, Ltd.
Takashi KYONO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EPITAXIAL WAFER, METHOD FOR PRODUCING THE SAME, PHOTODIODE, AND OPT...
Publication number
20140353584
Publication date
Dec 4, 2014
Sumitomo Electric Industries, Ltd.
Kei FUJII
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EPITAXIAL WAFER, METHOD FOR PRODUCING THE SAME, SEMICONDUCTOR ELEME...
Publication number
20140319463
Publication date
Oct 30, 2014
Sumitomo Electric Industries, Ltd.
Kei FUJII
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROCESSING METHOD AND FABRICATION METHOD OF SEMICONDUCTOR DEVICE
Publication number
20110236175
Publication date
Sep 29, 2011
Sumitomo Electric Industries, Ltd.
Kaoru Shibata
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Semiconductor Wafer and Semiconductor Wafer Inspection Method
Publication number
20100013058
Publication date
Jan 21, 2010
Sumitomo Electric Industries, Ltd.
Kaoru Shibata
G01 - MEASURING TESTING