Kaoru UMEMURA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample positioning method and charged particle beam apparatus
- Patent number 10,186,398
- Issue date Jan 22, 2019
- Hitachi High-Tech Science Corporation
- Masahiro Kiyohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,796,651
- Issue date Aug 5, 2014
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ion source, ion beam processing/observation apparatus, charged part...
- Patent number 8,779,400
- Issue date Jul 15, 2014
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 8,618,520
- Issue date Dec 31, 2013
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,569,719
- Issue date Oct 29, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probe contacting
- Patent number 8,525,537
- Issue date Sep 3, 2013
- Hitachi High-Technologies Corporation
- Kazuhiro Morita
- G01 - MEASURING TESTING
Information Patent Grant
Ion source, ion beam processing/observation apparatus, charged part...
- Patent number 8,481,980
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dual beam apparatus with tilting sample stage
- Patent number 8,431,891
- Issue date Apr 30, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,405,053
- Issue date Mar 26, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for processing a microsample
- Patent number 8,222,618
- Issue date Jul 17, 2012
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,999,240
- Issue date Aug 16, 2011
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,897,936
- Issue date Mar 1, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,888,639
- Issue date Feb 15, 2011
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Liquid metal ion gun
- Patent number 7,804,073
- Issue date Sep 28, 2010
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,791,050
- Issue date Sep 7, 2010
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Charge particle beam system, sample processing method, and semicond...
- Patent number 7,777,183
- Issue date Aug 17, 2010
- Hitachi High-Technologies Corporation
- Noriyuki Kaneoka
- G01 - MEASURING TESTING
Information Patent Grant
Alternate cylinder table to improve adjacent track interference pro...
- Patent number 7,733,589
- Issue date Jun 8, 2010
- Hitachi Global Storage Technologies Netherlands B.V.
- Toshiaki Wada
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for failure analysis and system for failure analysis
- Patent number 7,725,278
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Refilling method by ion beam, instrument for fabrication and observ...
- Patent number 7,709,062
- Issue date May 4, 2010
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion beam processing apparatus
- Patent number 7,700,931
- Issue date Apr 20, 2010
- Hitachi High-Tchnologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for ion beam fabrication
- Patent number 7,696,496
- Issue date Apr 13, 2010
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method for magnetic disk drive
- Patent number 7,661,187
- Issue date Feb 16, 2010
- Hitachi Global Storage Technologies Netherlands B.V.
- Masato Taniguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Ion source and mass spectrometer instrument using the same
- Patent number 7,645,983
- Issue date Jan 12, 2010
- Hitachi, Ltd.
- Atsumu Hirabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing equipment using ION beam or electron beam
- Patent number 7,592,606
- Issue date Sep 22, 2009
- Hitachi High-Technologies Corporation
- Koji Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,550,750
- Issue date Jun 23, 2009
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Focused ion beam apparatus for specimen fabrication
- Patent number 7,525,108
- Issue date Apr 28, 2009
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,470,918
- Issue date Dec 30, 2008
- Hitachi Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 7,465,945
- Issue date Dec 16, 2008
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Focused ion beam apparatus and liquid metal ion source
- Patent number 7,435,972
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Disk unit and manufacturing method thereof
- Patent number 7,423,825
- Issue date Sep 9, 2008
- Hitachi Global Storage Technologies Netherlands B.V.
- Naoki Shimamura
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE POSITIONING METHOD AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170092460
- Publication date Mar 30, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro KIYOHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM PROCESSING APPARATUS
- Publication number 20130320209
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...
- Publication number 20130284593
- Publication date Oct 31, 2013
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE
- Publication number 20120273692
- Publication date Nov 1, 2012
- Hitachi, Ltd
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20120085924
- Publication date Apr 12, 2012
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE
- Publication number 20110174974
- Publication date Jul 21, 2011
- Hitachi, Ltd
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20110140006
- Publication date Jun 16, 2011
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROBE CONTACTING
- Publication number 20110133765
- Publication date Jun 9, 2011
- Hitachi High-Technologies Corporation
- Kazuhiro Morita
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20110114476
- Publication date May 19, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ION BEAM PROCESSING APPARATUS
- Publication number 20100176297
- Publication date Jul 15, 2010
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...
- Publication number 20090230299
- Publication date Sep 17, 2009
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
APPARATUS AND METHOD OF SEMICONDUCTOR DEFECT INSPECTION
- Publication number 20090218490
- Publication date Sep 3, 2009
- Hitachi High-Technologies Corporation
- Shinichi SUZUKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20090008578
- Publication date Jan 8, 2009
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20080296516
- Publication date Dec 4, 2008
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20080296497
- Publication date Dec 4, 2008
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for ion beam fabrication
- Publication number 20080283778
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion source and mass spectrometer instrument using the same
- Publication number 20080237459
- Publication date Oct 2, 2008
- Atsumu Hirabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid metal ion gun
- Publication number 20080210883
- Publication date Sep 4, 2008
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20080191151
- Publication date Aug 14, 2008
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ION BEAM PROCESSING APPARATUS
- Publication number 20080073582
- Publication date Mar 27, 2008
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20080067385
- Publication date Mar 20, 2008
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Charged Particle Beam System, Sample Processing Method, and Semicon...
- Publication number 20080029699
- Publication date Feb 7, 2008
- Hitachi High-Technologies Corporation
- Noriyuki KANEOKA
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing Equipment Using ION Beam or Electron Beam
- Publication number 20080018460
- Publication date Jan 24, 2008
- Hitachi High-Technologies Corporation
- Koji Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid metal ion gun
- Publication number 20070257200
- Publication date Nov 8, 2007
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20070181831
- Publication date Aug 9, 2007
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20070158564
- Publication date Jul 12, 2007
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for processing a micro sample
- Publication number 20070158591
- Publication date Jul 12, 2007
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Charged particle beam system, semiconductor inspection system, and...
- Publication number 20070158560
- Publication date Jul 12, 2007
- Hitachi High-Technologies Corporation
- Noriyuki Kaneoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused ion beam apparatus and aperture
- Publication number 20070152174
- Publication date Jul 5, 2007
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145300
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING

Kaoru UMEMURA

Person

Patents Grantslast 30 patents

Sample positioning method and charged particle beam apparatus

Method and apparatus for specimen fabrication

Ion source, ion beam processing/observation apparatus, charged part...

Method and apparatus for processing a micro sample

Method and apparatus for specimen fabrication

Method and apparatus for probe contacting

Ion source, ion beam processing/observation apparatus, charged part...

Dual beam apparatus with tilting sample stage

Method and apparatus for specimen fabrication

Method and apparatus for processing a microsample

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for processing a micro sample

Liquid metal ion gun

Method and apparatus for specimen fabrication

Charge particle beam system, sample processing method, and semicond...

Alternate cylinder table to improve adjacent track interference pro...

Method for failure analysis and system for failure analysis

Refilling method by ion beam, instrument for fabrication and observ...

Ion beam processing apparatus

Apparatus for ion beam fabrication

Manufacturing method for magnetic disk drive

Ion source and mass spectrometer instrument using the same

Manufacturing equipment using ION beam or electron beam

Method and apparatus for processing a micro sample

Focused ion beam apparatus for specimen fabrication

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Focused ion beam apparatus and liquid metal ion source

Disk unit and manufacturing method thereof

Patents Applicationslast 30 patents

SAMPLE POSITIONING METHOD AND CHARGED PARTICLE BEAM APPARATUS

ION BEAM PROCESSING APPARATUS

ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...

METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR PROBE CONTACTING

Method and apparatus for specimen fabrication

ION BEAM PROCESSING APPARATUS

ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...

APPARATUS AND METHOD OF SEMICONDUCTOR DEFECT INSPECTION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

Apparatus for ion beam fabrication

Ion source and mass spectrometer instrument using the same

Liquid metal ion gun

Method and apparatus for specimen fabrication

ION BEAM PROCESSING APPARATUS

Method and apparatus for processing a micro sample

Charged Particle Beam System, Sample Processing Method, and Semicon...

Manufacturing Equipment Using ION Beam or Electron Beam

Liquid metal ion gun

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Charged particle beam system, semiconductor inspection system, and...

Focused ion beam apparatus and aperture

Method and apparatus for specimen fabrication