Kaoru Yamana

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection analyzing apparatus and semiconductor device
- Patent number 6,551,847
- Issue date Apr 22, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kyoko Asahina
- G01 - MEASURING TESTING
Information Patent Grant
Quality management system and recording medium
- Patent number 6,202,037
- Issue date Mar 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Hattori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Inspection analyzing apparatus and semiconductor device
- Publication number 20020081756
- Publication date Jun 27, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kyoko Asahina
- G01 - MEASURING TESTING