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Kapriel A. Krikorian
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Los Angeles, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Dismount step discrimination with temporal adaptive matched filteri...
Patent number
8,102,310
Issue date
Jan 24, 2012
Raytheon Company
Kapriel Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Dismount harmonic acceleration matched filtering for enhanced detec...
Patent number
7,973,699
Issue date
Jul 5, 2011
Kapriel Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Agile beam pulse to pulse interleaved radar modes
Patent number
7,965,226
Issue date
Jun 21, 2011
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Rapid scan LADAR 3D imaging with compact digital beam formation
Patent number
7,821,619
Issue date
Oct 26, 2010
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Wide area high resolution SAR from a moving and hovering helicopter
Patent number
7,728,756
Issue date
Jun 1, 2010
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Optically frequency generated scanned active array
Patent number
7,391,367
Issue date
Jun 24, 2008
Raytheon Company
Irwin L. Newberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Waveform ambiguity optimization for bistatic radar operation
Patent number
7,333,049
Issue date
Feb 19, 2008
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Technique for accurate estimate of large antenna inertial two dimen...
Patent number
7,298,325
Issue date
Nov 20, 2007
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Technique for low grazing angle 3D SAR target recognition
Patent number
7,205,927
Issue date
Apr 17, 2007
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Variable inclination array antenna
Patent number
7,205,948
Issue date
Apr 17, 2007
Raytheon Company
Kapriel V. Krikorian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Technique for compensation of transmit leakage in radar receiver
Patent number
7,202,812
Issue date
Apr 10, 2007
Raytheon Company
Kapriel V. Krikorian
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Robust detection technique of fixed and moving ground targets using...
Patent number
7,145,497
Issue date
Dec 5, 2006
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Pseudo GPS aided multiple projectile bistatic guidance
Patent number
7,121,502
Issue date
Oct 17, 2006
Raytheon Company
Kapriel V. Krikorian
F41 - WEAPONS
Information
Patent Grant
Technique for enhanced quality high resolution 2D imaging of ground...
Patent number
7,106,243
Issue date
Sep 12, 2006
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Technique for cancellation of elevated clutter for the detection of...
Patent number
7,095,358
Issue date
Aug 22, 2006
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Repetitive waveform generator recirculating delay line
Patent number
7,092,596
Issue date
Aug 15, 2006
Raytheon Company
Robert A. Rosen
G01 - MEASURING TESTING
Information
Patent Grant
MMW electronically scanned antenna
Patent number
7,061,443
Issue date
Jun 13, 2006
Raytheon Company
Jar J. Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for SAR processing without INS data
Patent number
7,038,612
Issue date
May 2, 2006
Raytheon Company
James G. Chow
G01 - MEASURING TESTING
Information
Patent Grant
Fast and slow time scale clutter cancellation
Patent number
7,006,034
Issue date
Feb 28, 2006
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Inverse precision velocity update for monopulse calibration
Patent number
6,853,330
Issue date
Feb 8, 2005
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Efficient wideband waveform generation and signal processing design...
Patent number
6,778,137
Issue date
Aug 17, 2004
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced emitter location using adaptive combination of time shared...
Patent number
6,759,981
Issue date
Jul 6, 2004
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for 3-dimensional synthetic aperture radar
Patent number
6,741,202
Issue date
May 25, 2004
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
All weather precision guidance of distributed projectiles
Patent number
6,653,972
Issue date
Nov 25, 2003
Raytheon Company
Kapriel V. Krikorian
F41 - WEAPONS
Information
Patent Grant
Radar imaging system and method
Patent number
6,650,274
Issue date
Nov 18, 2003
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Radar system and method
Patent number
6,650,272
Issue date
Nov 18, 2003
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Technique for robust characterization of weak RF emitters and accur...
Patent number
6,646,602
Issue date
Nov 11, 2003
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
Radar imaging system and method
Patent number
6,563,451
Issue date
May 13, 2003
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Grant
RF wide bandwidth lossless high performance low noise transmissive...
Patent number
6,175,672
Issue date
Jan 16, 2001
Raytheon Company
Irwin L. Newberg
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Technique for implementing very large pulse compression biphase codes
Patent number
6,020,843
Issue date
Feb 1, 2000
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DISMOUNT HARMONIC ACCELERATION MATCHED FILTERING FOR ENHANCED DETEC...
Publication number
20100245152
Publication date
Sep 30, 2010
Kapriel Krikorian
G01 - MEASURING TESTING
Information
Patent Application
DISMOUNT STEP DISCRIMINATION WITH TEMPORAL ADAPTIVE MATCHED FILTERI...
Publication number
20100245159
Publication date
Sep 30, 2010
Kapriel Krikorian
G01 - MEASURING TESTING
Information
Patent Application
AGILE BEAM PULSE TO PULSE INTERLEAVED RADAR MODES
Publication number
20100245162
Publication date
Sep 30, 2010
KAPRIEL V. KRIKORIAN
G01 - MEASURING TESTING
Information
Patent Application
Rapid scan LADAR 3D imaging with compact digital beam formation
Publication number
20090237640
Publication date
Sep 24, 2009
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Wide area high resolution SAR from a moving and hovering helicopter
Publication number
20090051585
Publication date
Feb 26, 2009
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Optically frequency generated scanned active array
Publication number
20080225375
Publication date
Sep 18, 2008
Raytheon Company
Irwin L. Newberg
G02 - OPTICS
Information
Patent Application
Novel waveform ambiguity optimization for bistatic radar operation
Publication number
20070188377
Publication date
Aug 16, 2007
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Technique for accurate estimate of large antenna inertial two dimen...
Publication number
20070126629
Publication date
Jun 7, 2007
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Technique for low grazing angle 3D SAR target recognition
Publication number
20060273946
Publication date
Dec 7, 2006
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Technique for compensation of transmit leakage in radar receiver
Publication number
20060273952
Publication date
Dec 7, 2006
Kapriel V. Krikorian
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Variable inclination array antenna
Publication number
20060267850
Publication date
Nov 30, 2006
Kapriel V. Krikorian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pseudo GPS aided multiple projectile bistatic guidance
Publication number
20060163422
Publication date
Jul 27, 2006
Raytheon Company
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
ROBUST DETECTION TECHNIQUE OF FIXED AND MOVING GROUND TARGETS USING...
Publication number
20060152402
Publication date
Jul 13, 2006
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUE FOR CANCELLATION OF ELEVATED CLUTTER FOR THE DETECTION OF...
Publication number
20060109161
Publication date
May 25, 2006
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Technique for enhanced quality high resolution 2D imaging of ground...
Publication number
20060109162
Publication date
May 25, 2006
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Optically frequency generated scanned active array
Publication number
20060067709
Publication date
Mar 30, 2006
Irwin L. Newberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MMW electronically scanned antenna
Publication number
20050219135
Publication date
Oct 6, 2005
Jar J Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for SAR processing without INS data
Publication number
20050073455
Publication date
Apr 7, 2005
James G. Chow
G01 - MEASURING TESTING
Information
Patent Application
ENHANCED EMITTER LOCATION USING ADAPTIVE COMBINATION OF TIME SHARED...
Publication number
20040135724
Publication date
Jul 15, 2004
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Optically frequency generated scanned active array
Publication number
20040090365
Publication date
May 13, 2004
Irwin L. Newberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RADAR IMAGING SYSTEM AND METHOD
Publication number
20030222808
Publication date
Dec 4, 2003
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
ALL WEATHER PRECISION GUIDANCE OF DISTRIBUTED PROJECTILES
Publication number
20030210170
Publication date
Nov 13, 2003
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Repetitive waveform generator recirculating delay line
Publication number
20030198432
Publication date
Oct 23, 2003
Robert A. Rosen
G02 - OPTICS
Information
Patent Application
Efficient wideband waveform generation and signal processing design...
Publication number
20030184472
Publication date
Oct 2, 2003
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUE FOR ROBUST CHARACTERIZATION OF WEAK RF EMITTERS AND ACCUR...
Publication number
20030169202
Publication date
Sep 11, 2003
Kapriel V. Krikorian
G01 - MEASURING TESTING
Information
Patent Application
Radar system and method
Publication number
20030132874
Publication date
Jul 17, 2003
Kapriel V. Krikorian
G01 - MEASURING TESTING