Kara L. Sherman

Follow

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for semiconductor adaptive testing using inline...
- Patent number 11,798,827
- Issue date Oct 24, 2023
- KLA Corporation
- Robert J. Rathert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for identifying latent reliability defects in sem...
- Patent number 11,754,625
- Issue date Sep 12, 2023
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Advanced in-line part average testing
- Patent number 11,293,970
- Issue date Apr 5, 2022
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for inline parts average testing and latent rel...
- Patent number 10,761,128
- Issue date Sep 1, 2020
- KLA-Tencor Corporation
- David W. Price
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR ADAPTIVE TESTING USING INLIN...
- Publication number 20220359247
- Publication date Nov 10, 2022
- Robert J. Rathert
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST...
- Publication number 20220196723
- Publication date Jun 23, 2022
- David W. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEM...
- Publication number 20210239757
- Publication date Aug 5, 2021
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
ADVANCED IN-LINE PART AVERAGE TESTING
- Publication number 20210215753
- Publication date Jul 15, 2021
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Inline Parts Average Testing and Latent Rel...
- Publication number 20180275189
- Publication date Sep 27, 2018
- KLA-Tencor Corporation
- David W. Price
- G06 - COMPUTING CALCULATING COUNTING