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Karanpreet Chahal
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Richardson, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Alignment mark for e-beam inspection of a semiconductor wafer
Patent number
7,171,035
Issue date
Jan 30, 2007
Texas Instruments Incorporated
Richard L. Guldi
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
Alignment mark for e-beam inspection of a semiconductor wafer
Publication number
20040086172
Publication date
May 6, 2004
Richard L. Guldi
H01 - BASIC ELECTRIC ELEMENTS