Karel D. van der Mast

Person

Pynacker, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 11,024,481
- Issue date Jun 1, 2021
- FEI Company
- Karel Diederick Van Der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 10,796,879
- Issue date Oct 6, 2020
- Phenom-World Holding B.V.
- Karel Diederick Van Der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample stage
- Patent number 10,580,613
- Issue date Mar 3, 2020
- Phenom-World Holding B.V.
- Gerhardus Bernardus Stamsnijder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correction device for correcting chromatic aberration in particle-o...
- Patent number 5,986,269
- Issue date Nov 16, 1999
- U.S. Philips Corporation
- Marcellinus P. C. M. Krijn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus comprising a detector for secondary elec...
- Patent number 5,578,822
- Issue date Nov 26, 1996
- U.S. Philips Corporation
- Karel D. Van Der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 5,336,885
- Issue date Aug 9, 1994
- U.S. Philips Corporation
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of selecting a spatial energy spread within an electron beam...
- Patent number 5,300,775
- Issue date Apr 5, 1994
- U.S. Philips Corporation
- Karel D. Van der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 5,221,844
- Issue date Jun 22, 1993
- U.S. Philips Corp.
- Karel D. van der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam apparatus
- Patent number 5,001,349
- Issue date Mar 19, 1991
- U.S. Philips Corporation
- Karel D. Van Der Mast
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam apparatus
- Patent number 4,977,324
- Issue date Dec 11, 1990
- U.S. Philips Corporation
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron image projector
- Patent number 4,902,930
- Issue date Feb 20, 1990
- U.S. Philips Corporation
- Karel D. Van Der Mast
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron beam apparatus comprising a semiconductor electron emitter
- Patent number 4,871,911
- Issue date Oct 3, 1989
- U.S. Philips Corporation
- Gerardus G. P. Van Gorkom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particles exposure apparatus having an optically deformable...
- Patent number 4,823,013
- Issue date Apr 18, 1989
- U.S. Philips Corp.
- Karel D. van der Mast
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of beam centering
- Patent number 4,820,921
- Issue date Apr 11, 1989
- U.S. Philips Corporation
- Johan G. Bakker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for energy-selective visualization
- Patent number 4,789,780
- Issue date Dec 6, 1988
- U.S. Philips Corporation
- Jan B. Le Poole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a cold cathode
- Patent number 4,766,340
- Issue date Aug 23, 1988
- Karel D. van der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatically adjustable electron microscope
- Patent number 4,618,766
- Issue date Oct 21, 1986
- U.S. Philips Corporation
- Karel D. van der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope (comprising an auxiliary lens)
- Patent number 4,306,149
- Issue date Dec 15, 1981
- U.S. Philips Corporation
- Jan B. Le Poole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 4,095,104
- Issue date Jun 13, 1978
- U.S. Philips Corporation
- Jan Bart LePoole
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20200402760
- Publication date Dec 24, 2020
- Phenom-World Holding B.V.
- Karel Diederick VAN DER MAST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE STAGE
- Publication number 20190287756
- Publication date Sep 19, 2019
- Phenom-World Holding B.V.
- Gerhardus Bernardus Stamsnijder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20190103245
- Publication date Apr 4, 2019
- Phenom-World Holding B.V.
- Karel Diederick VAN DER MAST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Stage
- Publication number 20170316913
- Publication date Nov 2, 2017
- Phenom-World Holding B.V.
- Gerhardus Bernardus Stamsnijder
- H01 - BASIC ELECTRIC ELEMENTS

Karel D. van der Mast

Person

Patents Grantslast 30 patents

Scanning electron microscope

Scanning electron microscope

Sample stage

Correction device for correcting chromatic aberration in particle-o...

Particle-optical apparatus comprising a detector for secondary elec...

Electron beam apparatus

Method of selecting a spatial energy spread within an electron beam...

Charged particle beam device

Charged-particle beam apparatus

Charged particle beam apparatus

Electron image projector

Electron beam apparatus comprising a semiconductor electron emitter

Charged particles exposure apparatus having an optically deformable...

Method of beam centering

Apparatus for energy-selective visualization

Semiconductor device having a cold cathode

Automatically adjustable electron microscope

Electron microscope (comprising an auxiliary lens)

Electron microscope

Patents Applicationslast 30 patents

SCANNING ELECTRON MICROSCOPE

SAMPLE STAGE

SCANNING ELECTRON MICROSCOPE

Sample Stage