Karel J. E. Van Eerdewijk

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Patents Grantslast 30 patents

Information Patent Grant
Testable carriers for integrated circuits
- Patent number 4,879,717
- Issue date Nov 7, 1989
- U.S. Philips Corp.
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuits, carriers therefor and testing apparatus and me...
- Patent number 4,791,358
- Issue date Dec 13, 1988
- U.S. Philips Corporation
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING