Karel Urbanek

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Atherton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dual collector optical flaw detector
- Patent number 4,597,665
- Issue date Jul 1, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING
Information Patent Grant
Non-contacting resistivity instrument with structurally related con...
- Patent number 4,302,721
- Issue date Nov 24, 1981
- Tencor Instruments
- Karel Urbanek
- G01 - MEASURING TESTING
Information Patent Grant
Probe for determining p or n-type conductivity of semiconductor mat...
- Patent number 4,282,483
- Issue date Aug 4, 1981
- Tencor Instruments
- George J. Kren
- G01 - MEASURING TESTING
Information Patent Grant
Gauge for measuring distance to planar surfaces and thicknesses of...
- Patent number 4,175,441
- Issue date Nov 27, 1979
- Tencor Instruments
- Karel Urbanek
- G01 - MEASURING TESTING
Information Patent Grant
Metrology instrument for measuring vertical profiles of integrated...
- Patent number 4,103,542
- Issue date Aug 1, 1978
- Tencor Instruments
- William R. Wheeler
- G01 - MEASURING TESTING