Karel Van Gils

Person

Heverlee, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for optical three dimensional topography measurement
- Patent number 11,287,248
- Issue date Mar 29, 2022
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical three dimensional topography measurement
- Patent number 10,634,487
- Issue date Apr 28, 2020
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition system, image acquisition method, and inspection...
- Patent number 9,886,764
- Issue date Feb 6, 2018
- KLA-Tencor Corporation
- Guoheng Zhao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for automatic pitch conversion of pick and pla...
- Patent number 9,776,334
- Issue date Oct 3, 2017
- KLA-Tencor Corporation
- Bert Vangilbergen
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Apparatus and method for three dimensional inspection of wafer saw...
- Patent number 9,140,546
- Issue date Sep 22, 2015
- KLA-Tencor Corporation
- Benoit Maison
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for three dimensional inspection of wafer saw...
- Patent number 9,103,665
- Issue date Aug 11, 2015
- KLA-Tencor Corporation
- Benoit Maison
- G01 - MEASURING TESTING
Information Patent Grant
Method and an apparatus for measuring positions of contact elements...
- Patent number 7,423,743
- Issue date Sep 9, 2008
- ICOS Vision Systems NV
- Carl Smets
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measuring positions of coplanarity of contract elements of an elect...
- Patent number 6,778,282
- Issue date Aug 17, 2004
- ICOS Vision Systems N.V.
- Carl Smets
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Optical Three Dimensional Topography Measurement
- Publication number 20200217651
- Publication date Jul 9, 2020
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Optical Three Dimensional Topography Measurement
- Publication number 20180209784
- Publication date Jul 26, 2018
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ACQUISITION SYSTEM, IMAGE ACQUISITION METHOD, AND INSPECTION...
- Publication number 20160048969
- Publication date Feb 18, 2016
- KLA-Tencor Corporation
- Guoheng ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR AUTOMATIC PITCH CONVERSION OF PICK AND PLA...
- Publication number 20140271084
- Publication date Sep 18, 2014
- KLA-Tencor Corporation
- Bert Vangilbergen
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
APPARATUS AND METHOD FOR THREE DIMENSIONAL INSPECTION OF WAFER SAW...
- Publication number 20120300039
- Publication date Nov 29, 2012
- KLA-Tencor Corporation
- Benoit Maison
- G01 - MEASURING TESTING
Information Patent Application
Method and an apparatus for measuring positions of contact elements...
- Publication number 20040085549
- Publication date May 6, 2004
- Carl Smets
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Karel Van Gils

Person

Patents Grantslast 30 patents

Method and system for optical three dimensional topography measurement

Method and system for optical three dimensional topography measurement

Image acquisition system, image acquisition method, and inspection...

Apparatus and method for automatic pitch conversion of pick and pla...

Apparatus and method for three dimensional inspection of wafer saw...

Apparatus and method for three dimensional inspection of wafer saw...

Method and an apparatus for measuring positions of contact elements...

Measuring positions of coplanarity of contract elements of an elect...

Patents Applicationslast 30 patents

Method and System for Optical Three Dimensional Topography Measurement

Method and System for Optical Three Dimensional Topography Measurement

IMAGE ACQUISITION SYSTEM, IMAGE ACQUISITION METHOD, AND INSPECTION...

APPARATUS AND METHOD FOR AUTOMATIC PITCH CONVERSION OF PICK AND PLA...

APPARATUS AND METHOD FOR THREE DIMENSIONAL INSPECTION OF WAFER SAW...

Method and an apparatus for measuring positions of contact elements...