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Karen D. Badger
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Georgia, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Mask program defect test
Patent number
8,538,129
Issue date
Sep 17, 2013
International Business Machines Corporation
Karen D. Badger
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for inspecting multi-layer reticles
Patent number
8,437,967
Issue date
May 7, 2013
International Business Machines Corporation
Karen D. Badger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Photomask image inspection
Patent number
7,974,802
Issue date
Jul 5, 2011
International Business Machines Corporation
Karen D. Badger
G01 - MEASURING TESTING
Information
Patent Grant
Alternating phase shift mask inspection using biased inspection data
Patent number
7,742,632
Issue date
Jun 22, 2010
International Business Machines Corporation
Karen D. Badger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Mask inspection DNIR replacement based on location of tri-tone leve...
Patent number
7,619,730
Issue date
Nov 17, 2009
International Business Machines Corporation
Karen D. Badger
G01 - MEASURING TESTING
Information
Patent Grant
Mask inspection process accounting for mask writer proximity correc...
Patent number
7,450,748
Issue date
Nov 11, 2008
International Business Machines Corporation
Karen D. Badger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Mask inspection DNIR placement based on location of tri-tone level...
Patent number
7,443,497
Issue date
Oct 28, 2008
International Business Machines Corporation
Karen D. Badger
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for reducing particulate contamination in a pelli...
Patent number
6,635,390
Issue date
Oct 21, 2003
International Business Machines Corporation
Karen D. Badger
B08 - CLEANING
Information
Patent Grant
Adaptive inspection method and system
Patent number
5,978,501
Issue date
Nov 2, 1999
International Business Machines Corporation
Karen Marie Dusablon Badger
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING MULTI-LAYER RETICLES
Publication number
20110184662
Publication date
Jul 28, 2011
International Business Machines Corporation
Karen D. Badger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Mask Program Defect Test
Publication number
20110085723
Publication date
Apr 14, 2011
International Business Machines Corporation
Karen D. Badger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Photomask Image Inspection
Publication number
20090228228
Publication date
Sep 10, 2009
International Business Machines Corporation
Karen D. Badger
G01 - MEASURING TESTING
Information
Patent Application
MASK INSPECTION PROCESS ACCOUNTING FOR MASK WRITER PROXIMITY CORREC...
Publication number
20080279443
Publication date
Nov 13, 2008
Karen D. Badger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MASK INSPECTION DNIR REPLACEMENT BASED ON LOCATION OF TRI-TONE LEVE...
Publication number
20080270059
Publication date
Oct 30, 2008
International Business Machines Corporation
Karen D. Badger
G01 - MEASURING TESTING
Information
Patent Application
Alternating phase shift mask inspection using biased inspection data
Publication number
20080089575
Publication date
Apr 17, 2008
Karen D. Badger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method Of Determining Photomask Inspection Capabilities
Publication number
20070174012
Publication date
Jul 26, 2007
Karen D. Badger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MASK INSPECTION DNIR PLACEMENT BASED ON LOCATION OF TRI-TONE LEVEL...
Publication number
20070050163
Publication date
Mar 1, 2007
International Business Machines Corporation
Karen D. Badger
G01 - MEASURING TESTING
Information
Patent Application
Mask inspection process accounting for mask writer proximity correc...
Publication number
20050117795
Publication date
Jun 2, 2005
International Business Machines Corporation
Karen D. Badger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY