Karen Darbinyan

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
On-chip memory diagnostics
- Patent number 11,527,298
- Issue date Dec 13, 2022
- Synopsys, Inc.
- Karen Darbinyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Periodic signal measurement using statistical sampling
- Patent number 9,541,591
- Issue date Jan 10, 2017
- Synopsys, Inc.
- Karen Darbinyan
- G01 - MEASURING TESTING
Information Patent Grant
Generation of memory structural model based on memory layout
- Patent number 9,514,258
- Issue date Dec 6, 2016
- Synopsys, Inc.
- Karen Amirkhanyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory hard macro partition optimization for testing embedded memories
- Patent number 9,336,342
- Issue date May 10, 2016
- Synopsys, Inc.
- Yervant Zorian
- G11 - INFORMATION STORAGE
Information Patent Grant
Architecture, system and method for compressing repair data in an i...
- Patent number 8,295,108
- Issue date Oct 23, 2012
- Synopsys, Inc.
- Karen Darbinyan
- G11 - INFORMATION STORAGE
Information Patent Grant
Architecture, system and method for compressing repair data in an i...
- Patent number 7,898,882
- Issue date Mar 1, 2011
- Synopsys, Inc.
- Karen Darbinyan
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for verifying IP integrity in system-on-chip (SOC...
- Patent number 7,673,264
- Issue date Mar 2, 2010
- Virage Logic Corp.
- Karen Darbinyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatuses that reduce the size of a repair data conta...
- Patent number 7,415,640
- Issue date Aug 19, 2008
- Virage Logic Corporation
- Yervant Zorian
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for a command based bist for testing memories
- Patent number 7,290,186
- Issue date Oct 30, 2007
- Virage Logic Corporation
- Yervant Zorian
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, method, and system having a pin to activate the self-tes...
- Patent number 7,149,924
- Issue date Dec 12, 2006
- Virage Logic Corporation
- Yervant Zorian
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
IN SITU DELAY MEASUREMENTS ON INTEGRATED CIRCUITS USING LIVE DATA A...
- Publication number 20250078882
- Publication date Mar 6, 2025
- Synopsys, Inc.
- Karen Darbinyan
- G11 - INFORMATION STORAGE
Information Patent Application
Periodic Signal Measurement Using Statistical Sampling
- Publication number 20160041212
- Publication date Feb 11, 2016
- Synopsys, Inc.
- Karen Darbinyan
- G01 - MEASURING TESTING
Information Patent Application
Generation of Memory Structural Model Based on Memory Layout
- Publication number 20130346056
- Publication date Dec 26, 2013
- Synopsys, Inc.
- Karen Amirkhanyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY HARD MACRO PARTITION OPTIMIZATION FOR TESTING EMBEDDED MEMORIES
- Publication number 20130080847
- Publication date Mar 28, 2013
- Synopsys, Inc.
- Yervant Zorian
- G01 - MEASURING TESTING
Information Patent Application
Architecture, System And Method For Compressing Repair Data In An I...
- Publication number 20110119531
- Publication date May 19, 2011
- Synopsys, Inc.
- Karen Darbinyan
- G11 - INFORMATION STORAGE
Information Patent Application
Architecture, System and Method for Compressing Repair Data in an I...
- Publication number 20080008015
- Publication date Jan 10, 2008
- Karen Darbinyan
- G11 - INFORMATION STORAGE

Karen Darbinyan

Person

Patents Grantslast 30 patents

On-chip memory diagnostics

Periodic signal measurement using statistical sampling

Generation of memory structural model based on memory layout

Memory hard macro partition optimization for testing embedded memories

Architecture, system and method for compressing repair data in an i...

Architecture, system and method for compressing repair data in an i...

System and method for verifying IP integrity in system-on-chip (SOC...

Methods and apparatuses that reduce the size of a repair data conta...

Method and apparatus for a command based bist for testing memories

Apparatus, method, and system having a pin to activate the self-tes...

Patents Applicationslast 30 patents

IN SITU DELAY MEASUREMENTS ON INTEGRATED CIRCUITS USING LIVE DATA A...

Periodic Signal Measurement Using Statistical Sampling

Generation of Memory Structural Model Based on Memory Layout

MEMORY HARD MACRO PARTITION OPTIMIZATION FOR TESTING EMBEDDED MEMORIES

Architecture, System And Method For Compressing Repair Data In An I...

Architecture, System and Method for Compressing Repair Data in an I...