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Karen HOVAKIMYAN
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated communication link testing
Patent number
11,789,070
Issue date
Oct 17, 2023
Tektronix, Inc.
Pirooz Hojabri
G01 - MEASURING TESTING
Information
Patent Grant
Joint optimization of FIR filters in a non-linear compensator
Patent number
11,329,633
Issue date
May 10, 2022
Tektronix, Inc.
Karen Hovakimyan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Real-time jitter impairment insertion for signal sources
Patent number
11,237,204
Issue date
Feb 1, 2022
Tektronix, Inc.
Gregory A. Martin
G01 - MEASURING TESTING
Information
Patent Grant
Integrated communication link testing
Patent number
11,009,546
Issue date
May 18, 2021
Tektronix, Inc.
Pirooz Hojabri
G01 - MEASURING TESTING
Information
Patent Grant
Linear and non-linear calibration for time interleaved digital-to-a...
Patent number
10,735,013
Issue date
Aug 4, 2020
Tektronix, Inc.
Karen Hovakimyan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Time interleaved digital-to-analog converter correction
Patent number
10,340,933
Issue date
Jul 2, 2019
Tektonix, Inc.
Karen Hovakimyan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Time interleaved analog to digital converter mismatch correction
Patent number
8,698,659
Issue date
Apr 15, 2014
Tektronix, Inc.
Karen Hovakimyan
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED COMMUNICATION LINK TESTING
Publication number
20240044975
Publication date
Feb 8, 2024
Tektronix, Inc.
Pirooz Hojabri
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED COMMUNICATION LINK TESTING
Publication number
20210270893
Publication date
Sep 2, 2021
Tektronix, Inc.
Pirooz Hojabri
G01 - MEASURING TESTING
Information
Patent Application
Linear and Non-Linear Calibration for Time Interleaved Digital-to-A...
Publication number
20200212922
Publication date
Jul 2, 2020
Tektronix, Inc.
Karen Hovakimyan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
REAL-TIME JITTER IMPAIRMENT INSERTION FOR SIGNAL SOURCES
Publication number
20200209307
Publication date
Jul 2, 2020
Tektronix, Inc.
Gregory A. Martin
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED COMMUNICATION LINK TESTING
Publication number
20190383873
Publication date
Dec 19, 2019
Tektronix, Inc.
Pirooz Hojabri
G01 - MEASURING TESTING
Information
Patent Application
Joint Optimization of FIR Filters in a Non-Linear Compensator
Publication number
20190312571
Publication date
Oct 10, 2019
Tektronix, Inc.
Karen Hovakimyan
G01 - MEASURING TESTING
Information
Patent Application
TIME INTERLEAVED ANALOG TO DIGITAL CONVERTER MISMATCH CORRECTION
Publication number
20140022101
Publication date
Jan 23, 2014
Tektronix, Inc.
Karen HOVAKIMYAN
H03 - BASIC ELECTRONIC CIRCUITRY