Karen L. E. Turnquest

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Pflugerville, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for photoresist trim endpoint detection
- Patent number 6,900,139
- Issue date May 31, 2005
- Advanced Micro Devices, Inc.
- Srikanteswara Dakshina-Murthy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for improved focus in optical processing
- Patent number 6,337,217
- Issue date Jan 8, 2002
- Advanced Micro Devices, Inc.
- Frederick N. Hause
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY