TREA

Karen M. Newstrom-Peitso

Follow

Person

  • Hopkins, MN, US
People

Patents Grantslast 30 patents

  • Information Patent Grant

    High temperature gas sensor
    • Patent number 11,002,700
    • Issue date May 11, 2021
    • Honeywell International Inc.
    • Alistair David Bradley
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Robust sensing film for fire gases
    • Patent number 10,497,486
    • Issue date Dec 3, 2019
    • Honeywell International Inc.
    • Robert E. Higashi
    • C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
  • Information Patent Grant

    Thermal conductivity detectors
    • Patent number 9,128,028
    • Issue date Sep 8, 2015
    • Honeywell International Inc.
    • Adam D. McBrady
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for wafer bonding using gold and indium
    • Patent number 8,513,091
    • Issue date Aug 20, 2013
    • Honeywell International Inc.
    • Robert Higashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Integral topside vacuum package
    • Patent number 8,188,561
    • Issue date May 29, 2012
    • Honeywell International Inc.
    • Robert E. Higashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micro fuel cell
    • Patent number 8,153,285
    • Issue date Apr 10, 2012
    • Honeywell International Inc.
    • Robert E. Higashi
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
  • Information Patent Grant

    Integral topside vacuum package
    • Patent number 7,875,944
    • Issue date Jan 25, 2011
    • Honeywell International Inc.
    • Robert E. Higashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ionization-based detection
    • Patent number 7,476,852
    • Issue date Jan 13, 2009
    • Honeywell International Inc.
    • Ulrich Bonne
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Integral topside vacuum package
    • Patent number 7,276,798
    • Issue date Oct 2, 2007
    • Honeywell International Inc.
    • Robert E. Higashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    HIGH TEMPERATURE GAS SENSOR
    • Publication number 20190154613
    • Publication date May 23, 2019
    • HONEYWELL INTERNATIONAL INC.
    • Alistair David Bradley
    • G01 - MEASURING TESTING
  • Information Patent Application

    ROBUST SENSING FILM FOR FIRE GASES
    • Publication number 20180164239
    • Publication date Jun 14, 2018
    • HONEYWELL INTERNATIONAL INC.
    • Robert E. Higashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    DEVICES, METHODS, AND SYSTEMS FOR WAFER BONDING
    • Publication number 20120112348
    • Publication date May 10, 2012
    • Honeywell International Inc.
    • Robert Higashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    THERMAL CONDUCTIVITY DETECTORS
    • Publication number 20120024043
    • Publication date Feb 2, 2012
    • Honeywell International Inc.
    • Adam D. McBrady
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTEGRAL TOPSIDE VACUUM PACKAGE
    • Publication number 20110070401
    • Publication date Mar 24, 2011
    • Honeywell International Inc.
    • Robert E. Higashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTEGRAL TOPSIDE VACUUM PACKAGE
    • Publication number 20080017944
    • Publication date Jan 24, 2008
    • Honeywell International Inc.
    • Robert E. Higashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Ionization-based detection
    • Publication number 20060289809
    • Publication date Dec 28, 2006
    • Ulrich Bonne
    • G01 - MEASURING TESTING
  • Information Patent Application

    Micro fuel cell
    • Publication number 20050142410
    • Publication date Jun 30, 2005
    • Robert E. Higashi
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
  • Information Patent Application

    Integral topside vacuum package
    • Publication number 20040140570
    • Publication date Jul 22, 2004
    • Robert E. Higashi
    • G01 - MEASURING TESTING