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Karen R. Sandberg
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Shelton, WA, US
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last 30 patents
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Patent Application
Two-Dimensional Optical Imaging Methods and Systems for Particle De...
Publication number
20120140223
Publication date
Jun 7, 2012
Particle Measuring Systems, Inc.
John MITCHELL
G01 - MEASURING TESTING
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Patent Application
Non-Orthogonal Particle Detection Systems and Methods
Publication number
20120012757
Publication date
Jan 19, 2012
Particle Measuring Systems, Inc.
John MITCHELL
G01 - MEASURING TESTING
Information
Patent Application
Non-Orthogonal Particle Detection Systems and Methods
Publication number
20110155927
Publication date
Jun 30, 2011
Particle Measuring Systems, Inc.
John MITCHELL
G01 - MEASURING TESTING
Information
Patent Application
TWO-DIMENSIONAL OPTICAL IMAGING METHODS AND SYSTEMS FOR PARTICLE DE...
Publication number
20090244536
Publication date
Oct 1, 2009
John Mitchell
G01 - MEASURING TESTING