Karl A. Rinder

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test and measurement probe having a touchscreen
- Patent number 11,719,721
- Issue date Aug 8, 2023
- Tektronix, Inc.
- Karl A. Rinder
- G01 - MEASURING TESTING
Information Patent Grant
Tip cable component of a measurement probe head assembly
- Patent number D992437
- Issue date Jul 18, 2023
- Tektronix, Inc.
- David Thomas Engquist
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Encapsulated component attachment technique using a UV-cure conduct...
- Patent number 11,385,258
- Issue date Jul 12, 2022
- Tektronix, Inc.
- Julie A. Campbell
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measurement probe head assembly
- Patent number D947693
- Issue date Apr 5, 2022
- Tektronix, Inc.
- David Thomas Engquist
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Back-drilled via attachment technique using a UV-cure conductive ad...
- Patent number 10,859,598
- Issue date Dec 8, 2020
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Flexible resistive tip cable assembly for differential probing
- Patent number 10,302,676
- Issue date May 28, 2019
- Tektronix, Inc.
- Michael J. Mende
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacking system support for electronic equipment
- Patent number D808969
- Issue date Jan 30, 2018
- Tektronix, Inc.
- Marc A. Gessford
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Stacking system support for electronic equipment
- Patent number D808970
- Issue date Jan 30, 2018
- Tektronix, Inc.
- Marc A. Gessford
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Differential pin to RF adaptor for probing applications
- Patent number 9,793,661
- Issue date Oct 17, 2017
- Tektronix, Inc.
- Michael J. Mende
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacking system for electronic equipment
- Patent number D776106
- Issue date Jan 10, 2017
- Tektronix, Inc.
- Marc A. Gessford
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Connector for selectively coupling an electrical load to a device u...
- Patent number 8,714,988
- Issue date May 6, 2014
- Tektronix, Inc.
- Karl A. Rinder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test and Measurement Probe Having a Touchscreen
- Publication number 20210263074
- Publication date Aug 26, 2021
- Tektronix, Inc.
- Karl A. Rinder
- G01 - MEASURING TESTING
Information Patent Application
ENCAPSULATED COMPONENT ATTACHMENT TECHNIQUE USING A UV-CURE CONDUCT...
- Publication number 20210018532
- Publication date Jan 21, 2021
- Tektronix, Inc.
- Julie A. Campbell
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
FLEXIBLE RESISTIVE TIP CABLE ASSEMBLY FOR DIFFERENTIAL PROBING
- Publication number 20170271826
- Publication date Sep 21, 2017
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL PIN TO RF ADAPTOR FOR PROBING APPLICATIONS
- Publication number 20170271828
- Publication date Sep 21, 2017
- Tektronix, Inc.
- Michael J. Mende
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Connector for Selectively Coupling an Electrical Load to a Device u...
- Publication number 20140120777
- Publication date May 1, 2014
- TEKTROINIX, INC.
- Karl A. Rinder
- G01 - MEASURING TESTING

Karl A. Rinder

Person

Patents Grantslast 30 patents

Test and measurement probe having a touchscreen

Tip cable component of a measurement probe head assembly

Encapsulated component attachment technique using a UV-cure conduct...

Measurement probe head assembly

Back-drilled via attachment technique using a UV-cure conductive ad...

Flexible resistive tip cable assembly for differential probing

Stacking system support for electronic equipment

Stacking system support for electronic equipment

Differential pin to RF adaptor for probing applications

Stacking system for electronic equipment

Connector for selectively coupling an electrical load to a device u...

Patents Applicationslast 30 patents

Test and Measurement Probe Having a Touchscreen

ENCAPSULATED COMPONENT ATTACHMENT TECHNIQUE USING A UV-CURE CONDUCT...

FLEXIBLE RESISTIVE TIP CABLE ASSEMBLY FOR DIFFERENTIAL PROBING

DIFFERENTIAL PIN TO RF ADAPTOR FOR PROBING APPLICATIONS

Connector for Selectively Coupling an Electrical Load to a Device u...