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Karl E. Geisel
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Montebello, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Compact scanner apparatus
Patent number
9,255,897
Issue date
Feb 9, 2016
Bradley L. Conway
G01 - MEASURING TESTING
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Patent Grant
Scanning X-ray inspection system using scintillation detection with...
Patent number
7,965,816
Issue date
Jun 21, 2011
Control Screening, L.L.C.
Scott D. Kravis
G01 - MEASURING TESTING
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Patent Grant
Etched coil unibody digital detector
Patent number
5,863,445
Issue date
Jan 26, 1999
Control Screening L.L.C.
Karl E. Geisel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Scanning X-ray inspection system using scintillation detection with...
Publication number
20100034353
Publication date
Feb 11, 2010
Scott D. Kravis
G01 - MEASURING TESTING