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Karl L. Major
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatuses including temperature-based threshold voltage compensat...
Patent number
12,183,416
Issue date
Dec 31, 2024
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device with selective command delay and associated me...
Patent number
11,990,195
Issue date
May 21, 2024
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device with selective command delay and associated me...
Patent number
11,468,960
Issue date
Oct 11, 2022
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device with power-saving mode and associated methods...
Patent number
11,416,333
Issue date
Aug 16, 2022
Micron Technology, Inc.
Boon Hor Lam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatuses including temperature-based threshold voltage compensat...
Patent number
11,335,385
Issue date
May 17, 2022
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatuses and methods for reducing access device sub-threshold le...
Patent number
10,998,022
Issue date
May 4, 2021
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatuses including temperature-based threshold voltage compensat...
Patent number
10,796,734
Issue date
Oct 6, 2020
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for analyzing electrical failure data
Patent number
7,319,935
Issue date
Jan 15, 2008
Micron Technology, Inc.
Xueqing Sun
G11 - INFORMATION STORAGE
Information
Patent Grant
Digit line equilibration using time-multiplexed isolation
Patent number
6,590,819
Issue date
Jul 8, 2003
Micron Technology, Inc.
Aaron M. Baum
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE WITH SELECTIVE COMMAND DELAY AND ASSOCIATED ME...
Publication number
20240304269
Publication date
Sep 12, 2024
Lodestar Licensing Group LLC
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE WITH SELECTIVE COMMAND DELAY AND ASSOCIATED ME...
Publication number
20230014661
Publication date
Jan 19, 2023
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE WITH POWER-SAVING MODE AND ASSOCIATED METHODS...
Publication number
20220382628
Publication date
Dec 1, 2022
Micron Technology, Inc.
Boon Hor Lam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUSES INCLUDING TEMPERATURE-BASED THRESHOLD VOLTAGE COMPENSAT...
Publication number
20220270654
Publication date
Aug 25, 2022
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE WITH SELECTIVE COMMAND DELAY AND ASSOCIATED ME...
Publication number
20210202023
Publication date
Jul 1, 2021
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE WITH POWER-SAVING MODE AND ASSOCIATED METHODS...
Publication number
20210055986
Publication date
Feb 25, 2021
Micron Technology, Inc.
Boon Hor Lam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUSES AND METHODS FOR REDUCING ACCESS DEVICE SUB-THRESHOLD LE...
Publication number
20210050042
Publication date
Feb 18, 2021
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUSES INCLUDING TEMPERATURE-BASED THRESHOLD VOLTAGE COMPENSAT...
Publication number
20210012818
Publication date
Jan 14, 2021
Micron Technology, Inc.
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Application
Method for detecting error correction defects
Publication number
20070162826
Publication date
Jul 12, 2007
Karl L. Major
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method, device and system for detecting error correction defects
Publication number
20070061669
Publication date
Mar 15, 2007
Karl L. Major
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
System and method for analyzing electrical failure data
Publication number
20060265156
Publication date
Nov 23, 2006
Micron Technology, Inc.
Xueqing Sun
G01 - MEASURING TESTING
Information
Patent Application
System and method for analyzing electrical failure data
Publication number
20040158783
Publication date
Aug 12, 2004
Micron Technology, Inc.
Xueqing Sun
G01 - MEASURING TESTING