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Karl Pietzsch
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Geretsried, DE
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last 30 patents
Information
Patent Grant
Infrared objective
Patent number
6,057,550
Issue date
May 2, 2000
Steinheil Optronik GmbH
Christoph Thoma
G02 - OPTICS
Information
Patent Grant
Infrared objective
Patent number
5,812,309
Issue date
Sep 22, 1998
Steinheil Optronik GmbH
Christoph Thoma
G02 - OPTICS
Information
Patent Grant
Method and apparatus for the optical detection of the roughness pro...
Patent number
4,973,164
Issue date
Nov 27, 1990
Erwin Sick GmbH Optik-Elektronik
Klaus Weber
G01 - MEASURING TESTING
Information
Patent Grant
Optical scanning apparatus for detecting faults in transparent mate...
Patent number
4,904,877
Issue date
Feb 27, 1990
Erwin Sick GmbH Optik-Elektronik
Karl Pietzsch
G01 - MEASURING TESTING
Information
Patent Grant
Light curtain with periodic light transmitter arrangement
Patent number
4,864,121
Issue date
Sep 5, 1989
Erwin Sick GmbH Optik-Elektronik
Karl Pietzsch
G01 - MEASURING TESTING
Information
Patent Grant
Scanner for the optical scanning of objects
Patent number
4,848,864
Issue date
Jul 18, 1989
Erwin Sick GmbH Optik-Electronik
Klaus Ostertag
G02 - OPTICS