Karl Zilles

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Koln, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for topographical presentation of alterations in an examined...
- Patent number 8,160,317
- Issue date Apr 17, 2012
- Forschungszentrum Juelich GmbH
- Katrin Amunts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging method
- Patent number 6,891,372
- Issue date May 10, 2005
- Forschungszentrum Julich GmbH
- Sven Steinhoff
- G01 - MEASURING TESTING
Information Patent Grant
Imaging process in the spatial frequency space and useful for exami...
- Patent number 6,781,372
- Issue date Aug 24, 2004
- Forschungszentrum Julich GmbH
- Nadim Joni Shah
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic resonance imaging method
- Patent number 6,707,299
- Issue date Mar 16, 2004
- Forschungszentrum Julich GmbH
- Nadim Joni Shah
- G01 - MEASURING TESTING
Information Patent Grant
High pressure polarizer for hyperpolarizing the nuclear spin of nob...
- Patent number 6,666,047
- Issue date Dec 23, 2003
- Forschungszentrum Julich GmbH
- Nadim Joni Shah
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Method for Topographical Presentation of Alterations in an Examined...
- Publication number 20080298653
- Publication date Dec 4, 2008
- FORSCHUNGSZENTRUM JULICH GmbH
- Katrin Amunts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Imaging method
- Publication number 20030076098
- Publication date Apr 24, 2003
- Sven Steinhoff
- G01 - MEASURING TESTING
Information Patent Application
Imaging method
- Publication number 20030057946
- Publication date Mar 27, 2003
- Nadim Joni Shah
- G01 - MEASURING TESTING
Information Patent Application
Method for analysing a sample
- Publication number 20030057945
- Publication date Mar 27, 2003
- Nadim Joni Shah
- G01 - MEASURING TESTING
Information Patent Application
Imaging method and a device for processng image data
- Publication number 20030042904
- Publication date Mar 6, 2003
- Stefan Wiese
- G01 - MEASURING TESTING
Information Patent Application
Technique to examine an object
- Publication number 20010024120
- Publication date Sep 27, 2001
- Nadim Joni Shah
- G01 - MEASURING TESTING