Karlheinz Krause

Person

Planegg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Acceleration of the programming of a memory module with the aid of...
- Patent number 7,173,840
- Issue date Feb 6, 2007
- Siemens Aktiengesellschaft
- Karlheinz Krause
- G11 - INFORMATION STORAGE
Information Patent Grant
Programming flash memory via a boundary scan register
- Patent number 6,937,493
- Issue date Aug 30, 2005
- Siemens Aktiengesellschaft
- Karlheinz Krause
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit including duplicated synchronous and asynchronou...
- Patent number 6,892,345
- Issue date May 10, 2005
- Siemens Aktiengesellschaft
- Majid Ghameshlu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low redesign application-specific module
- Patent number 6,742,150
- Issue date May 25, 2004
- Siemens Aktiengesellschaft
- Majid Ghameshlu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit comprising at least two clock systems
- Patent number 6,639,442
- Issue date Oct 28, 2003
- Siemens Aktiengesellschaft
- Majid Ghameshlu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated electronic module with hardware error infeed for checkin...
- Patent number 6,256,761
- Issue date Jul 3, 2001
- Siemens Aktiengesellschaft
- Johann Deix
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Acceleration of the programming of a memory module with the aid of...
- Publication number 20060041801
- Publication date Feb 23, 2006
- Karlheinz Krause
- G11 - INFORMATION STORAGE
Information Patent Application
Electronic component and method for measuring its qualification
- Publication number 20050015689
- Publication date Jan 20, 2005
- Friedrich Eppensteiner
- G01 - MEASURING TESTING
Information Patent Application
Electronic component
- Publication number 20050005216
- Publication date Jan 6, 2005
- Majid Ghameshlu
- G01 - MEASURING TESTING
Information Patent Application
Electronic component with output buffer control
- Publication number 20050005212
- Publication date Jan 6, 2005
- Majid Ghameshlu
- G01 - MEASURING TESTING
Information Patent Application
Method for developing an electronic component
- Publication number 20040139410
- Publication date Jul 15, 2004
- SIEMENS AKTIENGESELLSCHAFT
- Majid Ghameshlu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Programming flash memory via a boundary scan register
- Publication number 20040130944
- Publication date Jul 8, 2004
- SIEMENS AKTIENGESELLSCHAFT
- Karlheinz Krause
- G11 - INFORMATION STORAGE
Information Patent Application
Partial BIST with recording of the connections between individual b...
- Publication number 20040030976
- Publication date Feb 12, 2004
- Majid Ghameshlu
- G01 - MEASURING TESTING
Information Patent Application
System and method for testing electronic devices and modules
- Publication number 20040015330
- Publication date Jan 22, 2004
- Majid Ghameshlu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Boundary scan with mode control cells
- Publication number 20030167429
- Publication date Sep 4, 2003
- Karlheinz Krause
- G01 - MEASURING TESTING

Karlheinz Krause

Person

Patents Grantslast 30 patents

Acceleration of the programming of a memory module with the aid of...

Programming flash memory via a boundary scan register

Integrated circuit including duplicated synchronous and asynchronou...

Low redesign application-specific module

Integrated circuit comprising at least two clock systems

Integrated electronic module with hardware error infeed for checkin...

Patents Applicationslast 30 patents

Acceleration of the programming of a memory module with the aid of...

Electronic component and method for measuring its qualification

Electronic component

Electronic component with output buffer control

Method for developing an electronic component

Programming flash memory via a boundary scan register

Partial BIST with recording of the connections between individual b...

System and method for testing electronic devices and modules

Boundary scan with mode control cells