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Karma C. Fussell
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Garland, TX, US
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last 30 patents
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Patent Grant
Sensitive high throughput method for DNA damage and repair
Patent number
8,927,463
Issue date
Jan 6, 2015
Jeffrey D. Laskin
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SENSITIVE HIGH THROUGHPUT METHOD FOR DNA DAMAGE AND REPAIR
Publication number
20130274130
Publication date
Oct 17, 2013
Jeffrey D. Laskin
G01 - MEASURING TESTING