Kars Zege Troost

Follow

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of X-ray analysis in a particle-optical apparatus
- Patent number 6,646,263
- Issue date Nov 11, 2003
- FEI Company
- Laurens Franz Taemsz Kwakman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of X-ray analysis in a particle-optical apparatus
- Publication number 20020154731
- Publication date Oct 24, 2002
- Laurens Franz Taemsz Kwakman
- G01 - MEASURING TESTING