Karsten Sandig

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Palling, DE

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Patents Grantslast 30 patents

Information Patent Grant
Optical position-measurement device with varying focal length along...
- Patent number 11,353,583
- Issue date Jun 7, 2022
- Dr. Johannes Heidenhain GmbH
- Karsten Sändig
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring device
- Patent number 10,823,550
- Issue date Nov 3, 2020
- Dr. Johannes Heidenhain GmbH
- Karsten Sändig
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring instrument
- Patent number 9,766,098
- Issue date Sep 19, 2017
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring arrangement
- Patent number 7,872,762
- Issue date Jan 18, 2011
- Dr. Johannes Heidenhain GmbH
- Michael Hermann
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring arrangement
- Patent number 7,710,578
- Issue date May 4, 2010
- Dr. Johannes Heidenhain GmbH
- Karsten Sändig
- G01 - MEASURING TESTING
Information Patent Grant
Interferential position measuring arrangement
- Patent number 7,154,609
- Issue date Dec 26, 2006
- Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL POSITION-MEASUREMENT DEVICE
- Publication number 20210173080
- Publication date Jun 10, 2021
- Dr. Johannes Heidenhain Gmbh
- Karsten SÄNDIG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POSITION MEASURING DEVICE
- Publication number 20200041252
- Publication date Feb 6, 2020
- DR. JOHANNES HEIDENHAIN GmbH
- Karsten SÄNDIG
- G01 - MEASURING TESTING
Information Patent Application
Optical position measuring instrument
- Publication number 20110286004
- Publication date Nov 24, 2011
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Optical position measuring arrangement
- Publication number 20090195792
- Publication date Aug 6, 2009
- Johannes Heidenhain GmbH
- Michael Hermann
- G01 - MEASURING TESTING
Information Patent Application
Position measuring arrangement
- Publication number 20080062432
- Publication date Mar 13, 2008
- Dr. Johannes Heidenhain GmbH
- Karsten Sandig
- G01 - MEASURING TESTING
Information Patent Application
Interferential position measuring arrangement
- Publication number 20040090637
- Publication date May 13, 2004
- Wolfgang Holzapfel
- G01 - MEASURING TESTING