Karsten Stoll

Person

Sohland an der Spree, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Shielded probe systems with controlled testing environments
- Patent number 10,281,492
- Issue date May 7, 2019
- FormFactor Beaverton, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe systems with controlled testing environments
- Patent number 9,784,763
- Issue date Oct 10, 2017
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 9,395,411
- Issue date Jul 19, 2016
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for supporting and retaining a test substrate and a calibrati...
- Patent number 8,680,879
- Issue date Mar 25, 2014
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 8,497,693
- Issue date Jul 30, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for testing semiconductor substrates and comprising E...
- Patent number 8,278,951
- Issue date Oct 2, 2012
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with triaxial construction
- Patent number 8,240,650
- Issue date Aug 14, 2012
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for supporting and retaining a test substrate and a calibrati...
- Patent number 7,999,563
- Issue date Aug 16, 2011
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Probe support with shield for the examination of test substrates un...
- Patent number 7,652,491
- Issue date Jan 26, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for reproduction of a calibration position of an aligned...
- Patent number 7,265,536
- Issue date Sep 4, 2007
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus with loading device
- Patent number 7,038,441
- Issue date May 2, 2006
- SUSS MicroTec Testsystems GmbH
- Karsten Stoll
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS
- Publication number 20180031608
- Publication date Feb 1, 2018
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS
- Publication number 20170292974
- Publication date Oct 12, 2017
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST
- Publication number 20140184003
- Publication date Jul 3, 2014
- Cascade Microtech, Inc.
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20140028337
- Publication date Jan 30, 2014
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20110291680
- Publication date Dec 1, 2011
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20100289511
- Publication date Nov 18, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20090315581
- Publication date Dec 24, 2009
- SUSS MicroTec Test Systems GmbH
- Andrej RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
CHUCK WITH TRIAXIAL CONSTRUCTION
- Publication number 20080224426
- Publication date Sep 18, 2008
- SUSS MicroTec Test Systems GmbH
- Michael TEICH
- G01 - MEASURING TESTING
Information Patent Application
PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...
- Publication number 20080116917
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...
- Publication number 20080116918
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
Procedure for reproduction of a calibration position of an aligned...
- Publication number 20060212248
- Publication date Sep 21, 2006
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus with loading device
- Publication number 20040108847
- Publication date Jun 10, 2004
- Karsten Stoll
- G01 - MEASURING TESTING

Karsten Stoll

Person

Patents Grantslast 30 patents

Shielded probe systems with controlled testing environments

Shielded probe systems with controlled testing environments

Method for testing a test substrate under defined thermal condition...

Chuck for supporting and retaining a test substrate and a calibrati...

Method for testing a test substrate under defined thermal condition...

Probe station for testing semiconductor substrates and comprising E...

Chuck with triaxial construction

Chuck for supporting and retaining a test substrate and a calibrati...

Probe support with shield for the examination of test substrates un...

Procedure for reproduction of a calibration position of an aligned...

Test apparatus with loading device

Patents Applicationslast 30 patents

SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS

SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS

SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...

CHUCK WITH TRIAXIAL CONSTRUCTION

PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...

PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...

Procedure for reproduction of a calibration position of an aligned...

Test apparatus with loading device