Kasim Sader

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Doorwerth, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of producing a freestanding thin film of nano-crystalline gr...
- Patent number 9,908,778
- Issue date Mar 6, 2018
- FEI Company
- Bart Buijsse
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Method of examining a sample in a charged-particle microscope
- Patent number 9,312,098
- Issue date Apr 12, 2016
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Preparation of cryogenic sample for charged-particle microscopy
- Patent number 9,116,091
- Issue date Aug 25, 2015
- FEI Company
- Hervé-William Rémigy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of Producing a Freestanding Thin Film of Nano-Crystalline Ca...
- Publication number 20160096734
- Publication date Apr 7, 2016
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE
- Publication number 20150243474
- Publication date Aug 27, 2015
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PRODUCING A FREESTANDING THIN FILM OF NANO-CRYSTALLINE GR...
- Publication number 20150151972
- Publication date Jun 4, 2015
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Preparation of Cryogenic Sample for Charged-Particle Microscopy
- Publication number 20150090878
- Publication date Apr 2, 2015
- FEI Company
- Hervé-William Rémigy
- G01 - MEASURING TESTING