Kasumi OKABE

Person

Yokohama Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring method and measuring apparatus
- Patent number 12,072,273
- Issue date Aug 27, 2024
- Kioxia Corporation
- Kasumi Okabe
- G01 - MEASURING TESTING
Information Patent Grant
Imprint device, imprint method, and semiconductor device manufactur...
- Patent number 11,835,854
- Issue date Dec 5, 2023
- Kioxia Corporation
- Kasumi Okabe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Imprinting method, semiconductor device manufacturing method and im...
- Patent number 11,592,741
- Issue date Feb 28, 2023
- Kioxia Corporation
- Takeshi Higuchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR STORAGE DEVICE
- Publication number 20240322045
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Takanori AKITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240324178
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Kasumi OKABE
Information Patent Application
IMPRINT METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND M...
- Publication number 20240201600
- Publication date Jun 20, 2024
- KIOXIA Corporation
- Kasumi OKABE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEASURING METHOD AND MEASURING APPARATUS
- Publication number 20230194406
- Publication date Jun 22, 2023
- KIOXIA Corporation
- Kasumi OKABE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND IMPRINT METHOD
- Publication number 20220404703
- Publication date Dec 22, 2022
- KIOXIA Corporation
- Kasumi OKABE
- B82 - NANO-TECHNOLOGY
Information Patent Application
IMPRINTING METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND IM...
- Publication number 20210072640
- Publication date Mar 11, 2021
- KIOXIA Corporation
- Takeshi HIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPRINT TEMPLATE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20210041782
- Publication date Feb 11, 2021
- KIOXIA Corporation
- Takeshi HIGUCHI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMPRINT DEVICE, IMPRINT METHOD, AND SEMICONDUCTOR DEVICE MANUFACTUR...
- Publication number 20200387066
- Publication date Dec 10, 2020
- KIOXIA Corporation
- Kasumi OKABE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Kasumi OKABE

Person

Patents Grantslast 30 patents

Measuring method and measuring apparatus

Imprint device, imprint method, and semiconductor device manufactur...

Imprinting method, semiconductor device manufacturing method and im...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR STORAGE DEVICE

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MEMORY DEVICE

IMPRINT METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND M...

MEASURING METHOD AND MEASURING APPARATUS

SEMICONDUCTOR DEVICE AND IMPRINT METHOD

IMPRINTING METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND IM...

IMPRINT TEMPLATE AND METHOD FOR MANUFACTURING THE SAME

IMPRINT DEVICE, IMPRINT METHOD, AND SEMICONDUCTOR DEVICE MANUFACTUR...