Kate Donaldson-Stewart

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Essex, GB

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus
- Patent number 10,393,675
- Issue date Aug 27, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
- Patent number 10,215,716
- Issue date Feb 26, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING