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Katherine E. Violette
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Dallas, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Process for monitoring the thickness of layers in a microelectronic...
Patent number
6,605,482
Issue date
Aug 12, 2003
Texas Instruments Incorporated
Francis G. Celii
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit isolation
Patent number
6,326,281
Issue date
Dec 4, 2001
Texas Instruments Incorporated
Katherine E. Violette
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit and method
Patent number
6,287,924
Issue date
Sep 11, 2001
Texas Instruments Incorporated
Chih-Ping Chao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating a shallow doped region for a shallow junction...
Patent number
6,242,295
Issue date
Jun 5, 2001
Texas Instruments Incorporated
Mark S. Rodder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon processing method
Patent number
6,214,736
Issue date
Apr 10, 2001
Texas Instruments Incorporated
Antonio L. P. Rotondaro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitor and memory structure and method
Patent number
6,197,653
Issue date
Mar 6, 2001
Texas Instruments Incorporated
Rajesh B. Khamankar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Doped polysilicon to retard boron diffusion into and through thin g...
Patent number
6,030,874
Issue date
Feb 29, 2000
Texas Instruments Incorporated
Douglas T. Grider
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Tunnel oxide
Publication number
20020063279
Publication date
May 30, 2002
Men-Chee Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process for monitoring the thickness of layers in a microelectronic...
Publication number
20020055197
Publication date
May 9, 2002
Francis G. Celii
G01 - MEASURING TESTING