Kathleen J. Schulting

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Oregon, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Spectral measurement with assisted data analysis
- Patent number 8,140,500
- Issue date Mar 20, 2012
- Thermo Electron Scientific Instruments LLC
- Jerome J. Workman
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic microscopy with image-driven analysis
- Patent number 7,496,220
- Issue date Feb 24, 2009
- Thermo Electron Scientific Instruments LLC
- Federico Izzia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROSCOPIC MICROSCOPY WITH IMAGE-DRIVEN ANALYSIS
- Publication number 20080049220
- Publication date Feb 28, 2008
- Federico Izzia
- G02 - OPTICS
Information Patent Application
Spectral measurement with assisted data analysis
- Publication number 20070233401
- Publication date Oct 4, 2007
- Jerome J. Workman
- G01 - MEASURING TESTING